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Energy dispersive x ray spectrometer

Manufactured by Thermo Fisher Scientific
Sourced in United States

The Energy Dispersive X-ray Spectrometer (EDS or EDX) is a laboratory instrument used for elemental analysis of solid samples. It detects and measures the energy of X-rays emitted by a sample when it is exposed to a beam of electrons or X-rays, allowing for the identification and quantification of the elements present in the sample.

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3 protocols using energy dispersive x ray spectrometer

1

Characterization of Synthesized Copper Oxide Nanoparticles

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Different analytical techniques were utilized to characterize the synthesized NPs in order to assess their functionality. The functional groups of producing CuONPs were investigated using an FT-IR spectrometer (Bruker Scientific, Billerica, MA, USA). Using an X-ray diffractometer for powder (Bruker Scientific, Billerica, MA, USA), the crystalline structure of the produced CuONP was examined. The particle size of the nanoparticle was determined by zeta potential and a particle analyzer. High-resolution scanning electron microscopy (HRSEM) and an Energy Dispersive X-ray Spectrometer (EDS) were used to evaluate the elemental composition of CuONPs (Thermo Fisher Scientific, Waltham, MA, USA). High-resolution transmission electron microscopy JEM-2100 (HRTEM) (JEOL, Tokyo, Japan) was used to examine the structural characteristics of NPs.
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2

Orai1 Deficiency Impacts Bone Microstructure

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The analysis was performed at UCLA department of materials science and engineering core facility using a Nova NanoSEM 230 scanning electron microscope (FEI, USA) with field emission gun and variable pressure capabilities equipped with backscattered electron detectors and an energy dispersive x-ray spectrometer (ThermoScientific, USA). Femur samples from 8-week old Orai1−/− male mice and sex-matched WT littermate were fixed in 4% Glutaraldehyde overnight at 4′C, non-decalcified, resin-casted and coronal-sectioned at the distal metaphyseal area, sputter-coated with gold palladium, and subsequently examined with SEM.
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3

Characterization of HA-MWCNT Membranes

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The morphologies of the multi-walled carbon nanotubes, the HA-MWCNT and the fabricated membranes were recorded on Quattro field emission scanning electron microscope (FESEM, Waltham, MA, USA) fitted with an energy dispersive X-ray spectrometer (Thermo ScientificTM, Waltham, MA, USA). The specimens were coated by gold sputtering prior to analysis. X-ray diffraction patterns were obtained on a Rigaku Miniflex-II X-ray diffractometer using CuKα radiation in the range of 2θ 5°–80°. The FTIR spectra of the materials and the fabricated membranes were measured on NicoletTM iS5 FTIR spectrometer in the range of wavenumber 400–4000 cm−1. The surface wettability of the fabricated membranes was measured on DSA-25 drop-shaped contact angle analyzer (KRUSS Scientific, Hamburg, Germany) using a drop size of 5 µL. The surface topography and roughness of the membrane specimens were recorded on Agilent 5500 atomic force microscope (Agilent Technologies, Santa Clara, CA, USA). Micrometric ASAP 2020 (Brussels, Belgium) was used to measure the BET surface area and pore size distribution. High-purity N2 (99.999) gas was used under the liquid nitrogen condition.
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