The nanosuspensions were diluted 1:500 with demineralized water and dried over night at room temperature on a coverslip. A Helios™ G4 CX Dualbeam™ (Thermo Scientific™ Inc, Waltham, MA, USA) microscope was used in secondary electron mode at 2 kV and 3 mm working distance. Samples were sputtered with platinum.
Helios g4 cx dualbeam
Manufactured by Thermo Fisher Scientific
Sourced in United States
The Helios G4 CX DualBeam is a high-resolution scanning electron microscope (SEM) and focused ion beam (FIB) system. It combines a field emission electron column and a high-performance ion column to provide advanced imaging and milling capabilities for materials analysis and sample preparation.
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Lab products found in correlation
4 protocols using helios g4 cx dualbeam
1
Nanomaterial Characterization by SEM
2
Morphology and Agglomeration Analysis
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The morphology, size and the agglomeration status of the raw samples (without additives) and the ground samples were analyzed by a scanning electron microscope (Helios G4 CX Dual Beam, Thermo Fisher, Waltham, USA). In order to avoid electrical charge, the samples were sputtered with a thin layer of 6 nm platinum before analyzing.
3
Cryo-Preparation and FIB-SEM Imaging
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The sample was secured into a cryo shuttle by use of a freezing rivet and submerged into slushed nitrogen. The sample was then transferred under vacuum into a Quorum PP3010 cryo preparation chamber which was under high vacuum and pre-cooled to -140 °C. The sample was fractured using a cooled knife. Prior to imaging, an Iridium coating was sputtered onto the samples and it was transferred into a Thermo scientific Helios G4 CX DualBeam (Focused ion beam scanning electron microscope; FIB-SEM) operating at 1 or 2 kV and 0.1 nA. The FIB-SEM is fitted with a cold stage (-140 °C) and cold finger (-175 °C).
4
Cryo-SEM Sample Preparation and Imaging
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The sample was secured into a cryo shuttle by use of a freezing rivet and submerged into slushed nitrogen. The sample was then transferred under vacuum into a Quorum PP3010 cryo preparation chamber which was under high vacuum and pre-cooled to -140 • C. The sample was fractured using a cooled knife. Prior to imaging, an Iridium coating was sputtered onto the samples and it was transferred into a Thermo scientific Helios G4 CX DualBeam (Focused ion beam scanning electron microscope; FIB-SEM) operating at 2 kV and 0.1 nA. The FIB-SEM is fitted with a cold stage (-140 • C) and cold finger (-175 • C).
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