Jem 1400 instrument
The JEM-1400 is a transmission electron microscope (TEM) manufactured by JEOL. It is designed to provide high-quality imaging and analysis of a wide range of samples at the nanoscale level. The JEM-1400 uses an electron beam to interact with the specimen, allowing for the visualization and characterization of micro- and nanostructures.
Lab products found in correlation
11 protocols using jem 1400 instrument
Characterization of Polystyrene Nanoparticles
Silver Nanoparticle Interactions with Polystyrene
Characterization of Pristine and Fluorescent Polystyrene Nanoparticles
Structural and Textural Analysis of Materials
Textural properties were evaluated by nitrogen adsorption and desorption, and isotherm experiments were accomplished in a porosimeter Micromeritics ASAP 2000 instrument (Micromeritics, Norcross, GA, USA). Samples were previously degassed at 130 °C for 24 h under vacuum (p < 10−2 Pa). The specific surface area of the synthetized materials was calculated using the Brunauer, Emmett and Teller (BET) equation in the linear region (0.05 < Po < 0.22).
The TEM images were recorded in a JEOL JEM 1400 instrument (JEOL USA, Inc, Peabody, MA, USA) and assembled with a charge-coupled camera device (Zeiss, Oberkochen, Baden-Württemberg, Germany). Samples were previously suspended in ethanol and deposited on a copper grid.
SEM-EDX micrographs were acquired in a JEOL-SEM JSM-7800 LV scanning microscope.
Characterization of Nanocomposite Materials
Characterizing Protein Nanoparticle Microstructures
Quantitative Image Analysis Techniques
For fluorescence image analysis, pixel quantification was performed as described previously (Wald et al., 2011 (link)). Briefly, images were collected, avoiding pixel saturation in the channel to be measured. ROIs matching the size of positive signal images were defined and used throughout the sampling. Examples of ROIs are shown in
TEM Imaging of Fixed Cells
Multimodal Characterization of Purified Proteins
Atomic force microscopy was performed using an Integra Prima microscope and Nova SPM software (NT-MDT, Moscow, Russia). The scanning was performed in semi contact mode using gold cantilever NSG01 (NT-MDT).
Electron microscopy was performed on a JEM 1400 instrument (JEOL, Tokyo, Japan). Purified proteins were placed on carbon-formvar-coated copper grids (TED PELLA, Redding, CA, USA) and stained with 1% (w/v) uranyl acetate in methanol. The average size of the particles was determined using 10 particles.
Nanoparticle Size Characterization by TEM
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