In order to keep the biochar particles size uniformity, eliminate the interference of other substances and microbial interference in biochars, the original samples were treated as follows: the particle size of the biochar was 0.4–0.8 mm after grinding. The biochars and graphene samples were washed by deionized water to an invariable pH value and desiccated by vacuum freeze–drying. The microbial interference was excluded by 30 min UV irradiation. Finally, the carbon materials were characterized by SEM, FTIR spectrum and Raman spectrometer (InVia plus, Renishaw plc, Britain). Surface area of adsorbents (biochar and garphene) were determined by nitrogen adsorption using ASAP 2020 V3.04 H (Micromeritics).
Asap 2020 v3.04h
The ASAP 2020 V3.04H is an analytical instrument designed for surface area and pore size distribution analysis. It uses nitrogen adsorption at cryogenic temperatures to measure the specific surface area and pore structure characteristics of a wide range of materials, including powders, catalysts, and porous solids.
Lab products found in correlation
3 protocols using asap 2020 v3.04h
Biochar and Graphene Characterization
In order to keep the biochar particles size uniformity, eliminate the interference of other substances and microbial interference in biochars, the original samples were treated as follows: the particle size of the biochar was 0.4–0.8 mm after grinding. The biochars and graphene samples were washed by deionized water to an invariable pH value and desiccated by vacuum freeze–drying. The microbial interference was excluded by 30 min UV irradiation. Finally, the carbon materials were characterized by SEM, FTIR spectrum and Raman spectrometer (InVia plus, Renishaw plc, Britain). Surface area of adsorbents (biochar and garphene) were determined by nitrogen adsorption using ASAP 2020 V3.04 H (Micromeritics).
Characterization of Fiber Surface Morphology
The surface micro-morphological structures of the exterior and interior surfaces of the samples were examined by scanning electron microscopy (SEM, S-3400 N, Hitachi Ltd. Tokyo, Japan) at a voltage of 15 kV. Specimens were prepared for SEM inspection by placing the samples on carbon glue and then plating them with Pt (7 nm). Ultrathin sections of fibers were utilized to observe the changes in cell walls detected by transmission electron microscopy (TEM) and atomic force microscopy (AFM). TEM was conducted on a JEM-2100 microscope (JEOL, Tokyo, Japan). AFM was conducted on a Dimension 3100 microscope (Veeco Instruments Inc. Plainview, NY, USA). Images were captured using silicone cantilevers. The scanning rate ranged from 0.5 to 1.5 Hz.
Comprehensive Characterization of Material
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