The graphene films were inspected in situ using optical microscopy (Olympus BX 51 M) to obtain images with different magnifications displaying the morphologies of the graphene/SiO2 surfaces before and after different times of VHF exposure. A scanning electron microscope (Gemini, Zeiss, Ultra 55) was used to investigate the surface morphology of the samples at different acceleration voltages to obtain high-contrast images at different magnifications. EDX spectroscopy of graphene samples was also obtained with the same SEM tool to analyze trace elements on the graphene samples after VHF exposure. Raman spectroscopy was performed using an alpha300 R spectrometer (WITec) with a λ = 532 nm laser and a 100× objective. AFM images were obtained with a PSIA XE-100 (Park Systems) in tapping mode to analyze the morphologies and dimensions of the graphene grain boundaries after VHF exposure. A conventional probe station in connection with a SCS4200 parameter analyzer (Keithley) was used for four-probe measurements of the sheet resistances of the graphene samples before and after VHF exposure. LEEM/LEED characterization of CVD graphene on copper was done using a LEEM (FE-LEEM P90, Specs). The diffraction spots for dark-field imaging were selected by means of an aperture in the back focal plane of the objective lens.
Alpha 300 r spectrometer
Manufactured by WITec
The Alpha 300 R spectrometer is a versatile laboratory instrument designed for comprehensive Raman and photoluminescence analysis. It features a modular architecture that allows for customization to meet specific research requirements. The instrument's core function is to provide high-resolution spectroscopic measurements, enabling users to obtain detailed information about the chemical composition and structural properties of a wide range of materials.
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Lab products found in correlation
Jem 2200f, by JEOL (2 mentions)
Kbr windows, by PIKE Technologies (2 mentions)
Drx 500 spectrometer, by Bruker (2 mentions)
K alpha spectrometer, by Thermo Fisher Scientific (2 mentions)
Psia xe 100, by Park Systems (1 mentions)
Ultra 55, by Zeiss (1 mentions)
Bx51m, by Olympus (1 mentions)
Avance 400wb, by Bruker (1 mentions)
S 4800, by Hitachi (1 mentions)
Sta449f3, by Netzsch (1 mentions)
Nicolet 6700 ftir spectrometer, by PIKE Technologies (1 mentions)
Zetasizer nano, by Malvern Panalytical (1 mentions)
Nova nanosem 450 microscope, by Thermo Fisher Scientific (1 mentions)
Asap 2460 analyzer, by Micromeritics (1 mentions)
7 protocols using alpha 300 r spectrometer
1
Graphene Film Characterization by Multimodal Techniques
2
Comprehensive Characterization of 2D PhenPtCl2 Nanosheets
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The surface morphology of 2D PhenPtCl2 nanosheets were examined with SEM (Hitachi-S4800). Optical images were taken by optical microscope (SOPTOP CX40M). XRD measurements were performed on a Bruker Dimension Icon D8 Advance system using Cu Kα radiation (40 kV, 40 mA). TGA data were collected by thermal analysis system (NETZSCH STA449 F3). Solid-state nuclear magnetic resonance was analyzed by superconducting (solid) nuclear magnetic resonance (Bruker AVANCE 400WB). Infrared spectra were gathered by FT-IR (Thermo Fisher Scientific nicolt Is50). Raman spectra were performed using a WITec alpha 300 R spectrometer with 532 nm laser excitation. The X ray photoelectron spectrometer (XPS) spectra of these samples were analyzed by ESCALAB 250Xi XPS equipped with a monochromatic Al Kα source (λ = 1486.6 eV). The adventitious C 1s peak of ~284.8 eV was used for charging corrections. HAADF-STEM images and energy dispersive X-ray spectroscopy (EDS) mapping were acquired by the FEI Titan Cubed Themis G2 300 with a probe corrector and a monochromator at 200 kV. Photoemission endstations BL11B in Shanghai Synchrotron Radiation Facility (SSRF) was used for the help in characterizations.
3
Multimodal Spectroscopic Characterization
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X-ray photoelectron spectroscopy was performed by using an Escalab 250 spectrometer with an Al x-ray source (1486.6 eV). Nuclear magnetic resonance spectra were recorded on a Bruker DRX500 spectrometer (500 MHz). Infrared spectroscopy was performed by using a Nicolet 6700 FT-IR spectrometer equipped with a demountable cell (Part Num. 162–3600) with a pair of KBr windows (Pike Technologies). TEM was performed using a Jeol JEM-2200FS equipped with a Cs corrector. Raman spectroscopy was performed by using a Witec Alpha 300 R spectrometer with a laser excitation wavelength of 785 nm.
4
Raman Spectroscopy and HRTEM Analysis
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The Raman spectroscopy was performed by Alpha 300 R spectrometer (WITec) with a 532 nm laser source. The spot size of laser source was ~ 1 μm in diameter and the laser power was ~1 mW. High resolution transmission electron microscopy (HRTEM) images were acquired using an aberration-corrected Titan cube G2 operated at 80 kV
5
Characterization of textile materials
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FTIR-ATR spectroscopy was performed using a Frontier—Perkin Elmer, 64 scans with a resolution of 1 cm−1 using attenuated total reflectance (ATR) in the range between 650 and 4000 cm−1. Raman spectroscopy measurements were carried out using an Alpha 300 R spectrometer—Witec, containing a double monochromator, a 532 nm laser and a microscope with a 20× objective lens; 532 nm laser excitation lines were used. The laser power on the surface of the samples was approximately 7.5 mW cm−2 with an integration time of 3 s and a total of 10 scans. Zeta potential measurements were obtained in a Zetasizer Nano from Malvern Instruments. The readings were performed in triplicate on both sides of each sample at pH 6 and 25 °C. For the capillarity tests, a method was adapted from standard JIS L 1907—(Testing methods for water absorbency of textiles). Samples were cut into 20 × 2.5 cm strips and 1 cm of this strip was immersed in a solution containing a reactive dye Blue Turquoise Solae GLL. After 10 min, the height of the dye absorbed by capillarity was measured.
6
Spectroscopic Characterization of Novel Materials
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TEM was performed by using Jeol JEM-2200FS equipped with a Cs corrector. Raman spectroscopy was performed by using a Witec Alpha 300R spectrometer with a laser excitation wavelength of 785 nm. X-ray photoelectron spectroscopy was performed by using an Escalab 250 spectrometer with an Al x-ray source (1486.6 eV). Nuclear magnetic resonance spectra were recorded on a Bruker DRX500 spectrometer (500 MHz). Infrared spectroscopy was performed by using a Nicolet 6700 FT-IR spectrometer equipped with a demountable cell (Part Num. 162-3600) with a pair of KBr windows (Pike Technologies). Kelvin probe force microscopy was performed by using an SKP5050 Scanning Calvin probe (KP Technology). Electron energy loss and ultraviolet photoelectron spectroscopies were carried out in an ultra-high-vacuum chamber equipped with a VUV-5000 generator (40.8 eV He II laser) and a SES-100 detector. Detailed procedures for sample preparation were presented in Supplementary Methods .
7
Comprehensive Material Characterization Techniques
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Scanning electron microscopy (SEM) images were acquired using a FEI Nova NanoSEM 450 microscope with an accelerating voltage of 20 kV. Transmission electron microscopy (TEM) and high-resolution TEM (HRTEM) images were obtained using a Thermo Fisher Talos F200X microscope with an accelerating voltage of 200 kV. X-ray diffraction (XRD) patterns were recorded using a Haoyuan DX-2700BH diffractometer. Raman spectra were collected using a WITec Alpha 300R spectrometer with a laser wavelength of 532 nm at a power of 0.14 mW. X-ray photoelectron spectroscopy (XPS) measurements were performed using a Thermo Scientific K-Alpha spectrometer with Al Kα radiation. Nitrogen adsorption–desorption isotherms were recorded using a Micromeritics ASAP 2460 analyzer. Inductively coupled plasma optical emission spectroscopy (ICP-OES) was conducted using a Thermo Fisher ICAP PRO spectrometer.
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