V1 afm mica
The V1 AFM Mica is a high-quality mica substrate designed for use with atomic force microscopes (AFMs). It provides a smooth, atomically flat surface for imaging and analyzing samples at the nanoscale level. The mica substrate is a natural mineral that is known for its excellent surface properties, making it a popular choice for AFM applications.
Lab products found in correlation
2 protocols using v1 afm mica
DNA Origami Structural Analysis via AFM
Imaging DNA Origami Structures
After 10 minu of incubation at room temperature, the prepared sample was deposited on a freshly cleaved mica substrate (highest grade V1 AFM Mica, Ted-Pella Inc.), and subsequently incubated for 5 min. The substrate was washed with DI water by three times and gently dried by N2 gun (<0.1 kgf/cm2) immediately. AFM images were taken by NX10 (Park Systems) by using a PPP-NCHR probe having a spring constant of 42 N/m (Nanosensors). The non-contact mode was used to measure typically 5 μm × 5 μm of the sample area in 1024 × 1024 pixel resolution by using SmartScan software. All measured images were flattened with linear and quadratic order using XEI 4.1.0 program (Park Systems) prior to further analysis.
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