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V1 afm mica

Manufactured by Ted Pella

The V1 AFM Mica is a high-quality mica substrate designed for use with atomic force microscopes (AFMs). It provides a smooth, atomically flat surface for imaging and analyzing samples at the nanoscale level. The mica substrate is a natural mineral that is known for its excellent surface properties, making it a popular choice for AFM applications.

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2 protocols using v1 afm mica

1

DNA Origami Structural Analysis via AFM

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To avoid the possibility of unintended deformation or change of mechanical properties of the DNA origami structures induced by EtBr intercalation and mechanical damaging during gel electrophoresis, only unpurified samples were used in AFM measurement. One microlitre of annealed sample was diluted using 19 μl of folding solution (1 × TAE, 20 mM MgCl2), and deposited on a freshly cleaved mica substrate (highest grade V1 AFM Mica, Ted-Pella Inc.). After incubation for 5 min, the substrate was washed with DI water and gently dried by N2 gun for 1 min. AFM images were taken by NX10 (Park Systems) using non-contact mode in SmartScan software. A PPP-NCHR probe having spring constant of 42 N m−1 was used in the measurements (Nanosensors). Measured images were flattened with linear and quadratic order using XEI 4.1.0 program (Park Systems). Structural folding yield analysis and included angle measurement of DNA origami monomer structures from AFM images were done by custom scripts using MATLAB R2015b software (MathWorks Inc.). Typically, more than 250 monomer structures obtained from at least two different AFM images were used for each case.
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2

Imaging DNA Origami Structures

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DNA origami structures with 10 nM concentration containing folding buffer of 1× TAE and 20 mM MgCl2 (FOB20) were mixed with 1:19 ratio with DNA-binding molecules dissolved in FOB20 buffer to make 0.5 nM structure concentration with target binder concentration.
After 10 minu of incubation at room temperature, the prepared sample was deposited on a freshly cleaved mica substrate (highest grade V1 AFM Mica, Ted-Pella Inc.), and subsequently incubated for 5 min. The substrate was washed with DI water by three times and gently dried by N2 gun (<0.1 kgf/cm2) immediately. AFM images were taken by NX10 (Park Systems) by using a PPP-NCHR probe having a spring constant of 42 N/m (Nanosensors). The non-contact mode was used to measure typically 5 μm × 5 μm of the sample area in 1024 × 1024 pixel resolution by using SmartScan software. All measured images were flattened with linear and quadratic order using XEI 4.1.0 program (Park Systems) prior to further analysis.
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