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Phi 5600 xps

Manufactured by PerkinElmer
Sourced in United States

The PHI 5600 XPS is a high-performance X-ray photoelectron spectroscopy (XPS) system designed for surface analysis. It provides detailed information about the chemical composition and electronic structure of solid surfaces and thin films. The PHI 5600 XPS system is capable of performing quantitative and qualitative analysis of surface elements, chemical states, and depth profiling.

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4 protocols using phi 5600 xps

1

XPS Analysis of eADF4(C16) Biopolymer Coatings

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Chemical composition analysis was performed using a PHI 5600 XPS (PerkinElmer, Waltham, MA) with an ultrahigh vacuum chamber (10−9 torr) and a monochromatic Al Kα X-ray source operating at 350 W. Dry coatings were prepared on TiO2 using 2 mg/mL eADF4(C16) with 100 mM KH2PO4 and 100 mM NaCl in 25 mM bicine buffer (pH 8.5) for 30 hrs as described above in “General Coating Procedure”. Survey scans were taken from a binding energy range of 0 – 1100 eV for 5 mins each. High resolution scans were obtained for C1s (282 – 292 eV), O1s (526 – 536 eV), and N1s (396 – 404 eV) regions for 15 mins each. A neutralizer flood gun was used during scans to counter charging effects.
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2

Monitoring GSH-induced FKPN Disintegration

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The disintegration of FKPN in response to GSH was examined by analyzing the chemical states of iron using a Perkin Elmer PHI 5600 XPS. TEM imaging was used to record the morphology change of FKPN. Furthermore, the GSH depletion was measured using Ellman’s reagent50 (link). Briefly, DMSO solution containing DTNB (5 μL, 100 mM) was mixed with GSH solution (995 μL) with different concentrations (0, 0.625, 1.25, 2.5, 5, 10 mM). The absorbance of solutions in 24-well plates were determined by a Bio-Rad model-680 microplate reader (USA) at λ = 405 nm after incubation for 2 min, establishing AGSH standard curve. Meanwhile, the standard curve of nanoparticles (NPs) was determined through measuring the absorbance of NP solution (420 nm). Then different concentrations of GSH solutions (C0, 995 μL) were incubated with a certain concentration of NPs, followed by adding 5 μL of DMSO containing DTNB (100 mM). The absorption of the solutions in 96 well plates was detected by microplate reader at λ = 405 nm after standing for 10 min. The background absorption was subtracted from the sample absorption. The depletion of GSH (CX) were calculated by the formula: CX = (AX − ANPs)/(AGSH − ANPs) × C0.
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3

XPS Analysis of PDA and LAPDA Films

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XPS spectra of the pristine PDA and LAPDA films were obtained using Phi 5600 XPS (Perkin Elmer, USA) to analyze atomic compositions. A monochromatic X-ray source (Al Kα) was used for the data collection. To avoid the effect of surface charging, the neutralizer was applied simultaneously to the surfaces with a constant current (~1 µA). The at.%s were calculated by deconvolution of the XPS spectra with MATLAB-based software (MultiPak) provided by Physical Electronics, Inc.
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4

XPS Analysis of Functionalized Titanium

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To analyse elements on the surface of Ti and functionalised samples, XPS spectra were taken by using Phi 5600 XPS (Perkin Elmer, Waltham, Massachusetts, MA, USA). Monochromatic X-ray source (Al Kα) beam was used for the data collection. The neutraliser was additionally applied with a ~1-μA current to avoid the surface charging effect on the samples. The deconvolution of high-resolution N1s peaks and the calculation of the atomic percentages were done by using MATLAB-based software (MultiPak V9) developed by Physical Electronics.
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