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Escalab 250xi x ray photoelectron spectrometer xps

Manufactured by Thermo Fisher Scientific
Sourced in United States

The Escalab 250Xi X-ray photoelectron spectrometer (XPS) is a laboratory instrument used for surface analysis. It utilizes X-ray radiation to eject photoelectrons from the surface of a sample, allowing for the identification and quantification of the chemical elements present.

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3 protocols using escalab 250xi x ray photoelectron spectrometer xps

1

Characterization of Silica-Based Materials

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The microstructures of the SG and SG-VTS were imaged on S-4800 scanning electron microscopy (Hitachi, Japan). Fourier transform infrared (FTIR) spectra were obtained on a IS50 FTIR spectrometer (Nicolet, USA). Raman spectra were obtained on inVia Raman microscope (Renishaw, UK). Nuclear Magnetic Resonance (NMR) spectra of the SG and SG-VTS were recorded on Biospin Avance III spectrometer (Bruker, 29Si, 600 MHz, USA). Escalab 250Xi X-ray photoelectron spectrometer (XPS) (Thermo Scientific, USA) was used to measure surface element content and surface functional groups. SG and SG-VTS were thermogravimetrically analyzed in DSC3+ thermogravimetric analyzer (Mettler Toledo, Switzerland). The specific surface area and pore structure of SG and SG-VTS were measured on SSA-3000 specific surface area and porosity analyser (Builder, China). The specific surface area was calculated by the Brunauer–Emmett–Teller (BET) method. Pore diameter were calculated by Barrett–Joyner–Halenda (BJH) method.22,23
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2

Comprehensive Characterization of Ti4O7 Electrode

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The surface morphology and crystallinity of the Ti4O7 electrode was examined by a field emission scanning electron microscope (FESEM, Model No.: Hitachi S-4800, Japan) and an X-ray diffractometer (XRD, Model No.: Rigaku D/max-2550/PC), respectively. X-ray photoelectron spectroscopy was obtained from a Thermo Fisher Scientific Escalab 250Xi X-ray Photoelectron Spectrometer (XPS) under high vacuum (1 × 10−9 torr). The total organic carbon of real water samples was measured with a multi N/C 2100 TOC Analyzer (Analytik Jena AG, Germany). An MS5000 spectrometer (Freiberg Instruments Inc., Germany) was employed to obtain the electron paramagnetic resonance (EPR) spectra using 5,5-dimethyl-1-pyrroline-N-oxide (DMPO) as a radical trap. Ammonia concentration was measured by the Nessler reagent method15 (link) using a TU-1810 UV-vis spectrophotometer (Yixin Instruments Equipment Co., Ltd., Shenzhen) at a wavelength of 420 nm. The amount of N2 produced was calculated from the total nitrogen (30 mg L−1 ammonia) minus the measured concentration of ammonia and nitrate. NO3 and NO2 concentrations were determined with a DionexTM ICS-5000 ion chromatography system (IC, Thermo Fisher, USA). NB concentration was quantified by a waters 3000 high performance liquid chromatography system (UHPLC, USA) coupled with a C18 column at 262 nm.
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3

Microstructural Analysis of SG Composites

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The S-4800 scanning electron microscopy (Hitachi, Tokyo, Japan) was used to image the microstructures of SG, SG-VTS, SG-VTS-VP, and SG-VTS-VPQ. Fourier transform infrared (FTIR) spectra were obtained on a IS50 FTIR spectrometer (Nicolet, Madison, WI, USA). Nuclear magnetic resonance (NMR) spectra of the SG-VTS-VP and SG-VTS-VPQ were recorded on a Biospin Avance III spectrometer (Bruker, 13C, 600 MHz, Boston, MA, USA). Escalab 250Xi X-ray photoelectron spectrometer (XPS) (Thermo Scientific, Waltham, MA, USA) was used to measure surface element content and surface functional groups. SG-VTS and SG-VTS-VP were thermogravimetrically analyzed in DSC3+ thermogravimetric analyzer (Mettler Toledo, Switzerland). The specific surface area and pore structure of SG, SG-VTS, SG-VTS-VP, and SG-VTS-VPQ were measured on an SSA-3000 specific surface area and porosity analyser (Builder, Beijing, China). The specific surface area was calculated by the Brunauer–Emmett–Teller (BET) method. Pore diameter were calculated by Barrett–Joyner–Halenda (BJH) method [21 (link),22 (link)].
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