Atomic force microscopy was carried out to investigate the effect of plasma treatment times on surface roughness. The surface topography of the plasma-treated spin-coated samples was analyzed using a Nanoscope IIIa Atomic Force Microscope (AFM) (Digital Instruments, Santa Barbara, CA). The images were captured in the tapping mode with the use of monolithic silicon NCH-50 Point Probe (NanoWorld AG, Neuchatel, Switzerland). The scan size was set at 15 × 15μm and the surface was scanned at the rate of 1 Hz using 256 × 256 pixels of resolution. Surface roughness measurements (RMS value) and the 3-dimensional topographical images were recorded using Nanoscope image processing software version 5.12r5 (Digital Instruments). 5 sets of measurements were done for each plasma time (n = 5).
Nch 50 point probe
Manufactured by NanoWorld
Sourced in Switzerland
The NCH-50 Point Probe is a lab equipment designed for precision measurements. It features a 50-micron probe tip for accurate point-to-point contact with samples. The device is suitable for a range of applications requiring high-resolution surface analysis.
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2 protocols using nch 50 point probe
1
Plasma Treatment Effect on Surface Roughness
2
Analyzing Surface Roughness of PMMA
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Surface roughness of PMMA sheets (n = 6 in each group) was analyzed using a Nanoscope IIIa atomic force microscope (AFM; Digital Instruments, Santa Barbara, CA, USA). Topographic images were captured in tapping mode, employing monolithic silicon NCH-50 Point Probe (NanoWorld AG, Neuchatel, Switzerland). RMS value was averaged from 3 different scan areas from each sample. Surface morphology of PMMA sheets was observed by SEM. In brief, the PMMA sheets were mounted on a specimen stub secured by carbon adhesive tape. The sheets were sputter-coated with a 10-nm-thick layer of platinum and then examined with a JSM-7600F microscope (JEOL, Tokyo, Japan). Surface elemental composition was assessed by EDX spectroscope attached to the SEM. Percentage of an elemental concentration was averaged from 3 random scan areas of each sample.
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