Jsm 7800f microscope

The characterization was measured in an ambient atmosphere. A Keithley 2400 (Keithley, Cleveland, OH, USA) source was used to measure the current density and voltage (J−V) curves at an intensity of 100 mW/cm² at AM 1.5G. X-ray diffractions (XRDs) were analyzed using a Rigaku Miniflex powder X-ray diffractometer (Rigaku, Tokyo, Japan) equipped with a CuKα (1.54 Å) radiation source in the range of 0.7–95° with a step size of 0.01° under 40 kV, 15 mA. Scanning electron microscopy (SEM) images and energy dispersive spectroscopy (EDS) spectra were analyzed using 10 kV field emission on a JEOL JSM-7800F microscope (JEOL, Tokyo, Japan). UV-vis spectrum was measured by JASCO V770 spectrophotometer (JASCO, Tokyo, Japan) and the bandgap was determined via a Tauc plot.

Liquid chromatographic analyses were performed using an Agilent 1260 Infinity HPLC system (Agilent, Palo Alto, CA, USA) equipped with a binary high-pressure pump for mobile phase delivery and an autosampler. Identification and quantification of the analytes were performed on an Agilent 6420 triple quadrupole MS with electrospray source using the Agilent MassHunter Software (version B.06.00) for data analyses.
Magnetic stirrers from J.P. Selecta, S.A. (Barcelona, Spain) and a Vibramax 110 shaker from Heidolph Instruments (Schwabach, Germany) were used for the stirring during extraction and elution procedures, respectively.
Scanning electron microscope (SEM) images were obtained by using a JEOL JSM 7800F microscope (JEOL, Tokyo, Japan) at the Central Service for Research Support (SCAI) of the University of Córdoba. ATR-IR spectra were acquired with a Bruker Tensor 37 FT-IR spectrometer (Bruker Optik, GmbH, Ettlingen, Germany) equipped with a three internal reflections diamond ATR cell (Platinum ATR accessory, Bruker). Data collection and processing were done using the OPUS software package (Bruker, Ettlingen, Germany). Contact angle measurements were performed in a Ramé-hart Model 200 Standard Goniometer with DropImage Standard v2.3 equipped with an automated dispensing system at the Instituto de Ciencia Molecular (ICMol) of the University of Valencia.

Room-temperature and variable temperature XRD patterns were acquired using a Rigaku SmartLab X-ray diffractometer (9 KW) by CuKα radiation (λ = 1.5406 Å). The crystal structures were refined employing Rietveld refinement method through the General Structure Analysis System program. Scanning electron microscope (SEM) images were captured using a JEOL JSM-7800F microscope. HRTEM observations, SAED patterns, HAADF-STEM images, elemental mapping distribution, and energy dispersive X-ray spectrometry (EDS) were obtained utilizing a JEOL JEMF200 microscope. For the preparation of TEM samples, the phosphors were dispersed in ethanol, then dropped on a copper grid and dried on a hot plate (423 K), and tested on small crystals. Impurity element analysis was performed using an ICP-MS spectrometer equipped with an Agilent 7850 spectrometer. X-ray photoelectron spectroscopy (XPS) analysis was performed on a Thermo Fischer ESCALAB 250Xi XPS microprobe with monochromatic Al Kα (hν = 1486.6 eV) radiation as the X-ray source. Electron paramagnetic resonance (EPR) spectra were measured using a Bruker A300 spectrometer operating at a frequency of 9.2 GHz. PFM hysteresis loops were measured using a Bruker Multimode 8 atomic force microscope.

The five hydrotalcites studied
were characterized by X-ray diffraction (XRD) and Raman spectroscopy,
thermogravimetric analysis, and elemental and X-ray fluorescence (XRF)
spectroscopy. XRD patterns were recorded over the 2θ range 2–70°
by using Cu Kα radiation on a Siemens D-5000 spectrometer, and
Raman spectra were acquired over the wavenumber range 140–1700
cm^–1 by using green laser light (532 nm) on a Raman
Renishaw spectrophotometer equipped with an InVia microscope. All
spectral processing (baseline correction, smoothing) was done with
the software Wire v.3.4 from Renishaw. Fourier transform infrared
(FT-IR) spectroscopy was used from 4000 to 250 cm^–1 on a FT-IR Nicolet Magna IR 500 instrument. Thermogravimetric analyses
(TGA) were done by using a Setaram SetSys 12 analyzer. Measurements
were made on 20 mg samples that were placed in an alumina crucible
and heated from 30 to 800 °C at 10 °C min^–1 under an air stream flowing at 50 mL min^–1. Scanning
electron micrographs and energy-dispersive spectra were obtained with
a JEOL JSM 7800F microscope at a voltage of 15 kV and a distance of
10 mm. High-resolution transmission electron micrographs were obtained
with a JEOL JEM 1400 microscope.

SEM images were taken on a JEOL JSM 7800 F microscope at an operation voltage of 10 kV. TEM imaging and selected-area electron diffraction analysis were performed on an FEI Tecnai Spirit 12 microscope at an operation voltage of 120 kV. HRTEM and HAADF-STEM imaging were carried out on an FEI Tecnai F20 microscope equipped with an Oxford energy-dispersive X-ray analysis system.

Nitrogen adsorption–desorption isotherms were measured using a NOVA 4000 surface area analyzer (Quantachrome, Boynton Beach, FL, USA). Before measurements, the obtained PPMIP, BPAMIP, and NIP particles were outgassed at 100 °C for 8 h. The specific surface areas and pore volumes of the PPMIP, BPAMIP, and NIP particles were calculated using the standard Brunauer-Emmett-Teller (BET) method, and their pore size distributions were calculated using Barrett-Joyner-Halenda (BJH) theory. Scanning electron microscopy (SEM) images were obtained via a JEOL JSM-7800F microscope (Tokyo, Japan).