Strongyloxea from T. aurantia sponges were received dried and separated from the surrounding spongin. The Sxa were first examined using a polarized light microscope (Nikon Ci Pol). Intact, undamaged Sxa were mounted to aluminum stubs using conductive carbon tape. The mounted Sxa were sputter coated with approximately 10 nm of carbon and then imaged with a scanning electron microscope (FEI Helios, or LEO 1530 VP) at roughly 500X magnification. At this magnification, the field of view was roughly 250 μm × 200 μm in the FEI Helios (130 μm × 90 μm in the LEO 1530 VP). Therefore, a complete image of a Sxa consisted of 7–14 overlapping frames. These frames were aligned and stitched together to make a single composite image using a Fourier transform-based phase correlation method implemented in ImageJ58 (link). A representative composite image is shown in Supplementary Fig. S1 .
Ci pol
Manufactured by Nikon
Sourced in Japan
The Ci-POL is a microscope objective designed for polarized light microscopy. It is intended for use in various fields of study, including material science, mineralogy, and biological research, where the analysis of birefringent materials is required. The Ci-POL objective provides high-quality imaging and allows for the observation and analysis of the optical properties of samples under polarized light conditions.
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Lab products found in correlation
5 protocols using ci pol
1
Scanning Electron Microscopy of Strongyloxea
2
Polymorphic Ellipticine Crystals Characterization
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The single-crystal X-ray diffraction for polymorphic crystals were collected with a Bruker D8 Venture equipped with a four-circle kappa diffractometer and Photon 100 detector. The crystal structures were phased by direct methods and refined by full matrix least-squares methods using the software package SHELX-2014-3 (Sheldrick, 2008). The cif files can be obtained free of charge from the Cambridge Crystallographic Data Center as CCDC ELLIPT (polymorph I), and CCDC 1817466 (polymorph II).
The CPOM detections of ellipticine films were using Nikon Ci-POL. Agilent Cary 60 UV-vis spectrometer was used to collect the solution-state and solid-state UV-visible absorptions. The film topology was characterized using an Asylum Research Cypher (Oxford Instruments). GGIXD measurements for thin films were carried out at beamline 8-ID-E (with beam energy of 10.91 keV) at the Argonne National Laboratory. For the measurements, the samples on Si substrate were detected with a 228-mm sample-to-detector distance under helium atmosphere. The diffraction patterns were collected with the film coating direction put parallel and perpendicular to the X-ray. The incidence angle was 0.14° and the exposure time was 5 s. Data analysis was performed using the software GIXSGUI.
The CPOM detections of ellipticine films were using Nikon Ci-POL. Agilent Cary 60 UV-vis spectrometer was used to collect the solution-state and solid-state UV-visible absorptions. The film topology was characterized using an Asylum Research Cypher (Oxford Instruments). GGIXD measurements for thin films were carried out at beamline 8-ID-E (with beam energy of 10.91 keV) at the Argonne National Laboratory. For the measurements, the samples on Si substrate were detected with a 228-mm sample-to-detector distance under helium atmosphere. The diffraction patterns were collected with the film coating direction put parallel and perpendicular to the X-ray. The incidence angle was 0.14° and the exposure time was 5 s. Data analysis was performed using the software GIXSGUI.
3
Polarized Light Microscopy of Glycerol-Water Samples
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Sample was suspended in a mixture of glycerol/water (1,1 V/V) and a drop of the suspension was observed using an optical polarized light microscope (CiPOL, Nikon, Japan). All micrographs were observed at 400-times magnification.
4
Optical Characterization of Materials
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All characterizations were performed at room temperature under an ambient environment. All micrographs were recorded under the reflective mode of an optical microscope (Ci POL, Nikon, Japan) with crossed polarizer and analyzer. The transmittance spectra were measured with a halogen light source (iDH2000H-HP, ideaoptics, China), the achromatic quarter-wave plate, the broadband polarizer, and a spectrometer (PG2000-Pro-EX, ideaoptics, China). The supercontinuum fiber laser (SuperK EVO, NKT Photonics, Denmark) was filtered at different monochromatic wavelengths by the multi-channel acousto-optic tunable filter (SuperK SELECT, NKT Photonics, Denmark). Reflected diffraction patterns were captured by a CCD camera (DCC1645C-HQ, Thorlabs, USA) or a digital camera (EOS M, Canon, Japan).
5
Microalgal and Rotifer Density Quantification
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Microalgal density was measured by cell counting using a hemocytometer and inverted optical microscope (37XB, Shanghai Optical Instrument, China). The rotifer density was estimated using a zooplankton counter under a dissection microscope (JSZ5B, Yongxin, China). The morphology of the rotifer was observed and photographed using a light microscope (Ci-POL, Nikon, Japan).
Chl a fluorescence (OJIP) transients of N. oculata cells during the incubation were measured with a Handy PEA fluorometer combined with a liquid-phase adapter (Hansatech, UK). All measurements were performed with cells dark-adapted for 10 min at room temperature.
Chl a fluorescence (OJIP) transients of N. oculata cells during the incubation were measured with a Handy PEA fluorometer combined with a liquid-phase adapter (Hansatech, UK). All measurements were performed with cells dark-adapted for 10 min at room temperature.
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