For determination of the elemental composition of the rice husk extract (RHE), milling and subsequent screening of the husk were performed, while to obtain the solids contained in the rice husk extract, lyophilization was used (Labconco company, Kansas City, MO, USA). The resulting solid was weighed (0.2 g) and analyzed by X-ray fluorescence (Panalytical, Epsilon 1, Almelo, The Netherlands), before being integrated by a spectrometer with the use of the Omniam software [35 (link)]. For the total solids content in the rice husk extract, the liquid part was evaporated, and the rest of the solids were weighed and heated at 600 °C for 3 h for the de-ashed content.
Epsilon 1
Manufactured by Malvern Panalytical
Sourced in United Kingdom, Spain
The Epsilon 1 is an X-ray fluorescence (XRF) spectrometer designed for elemental analysis. It is capable of determining the chemical composition of a wide range of solid, powder, and liquid samples. The Epsilon 1 uses advanced X-ray technology to excite and detect the characteristic X-rays emitted by the sample, allowing for the identification and quantification of elements present.
Automatically generated - may contain errors
Lab products found in correlation
Ultima 4 x, by Rigaku (1 mentions)
Jem 2100, by JEOL (1 mentions)
Fp 6300, by Jasco (1 mentions)
V 650, by Jasco (1 mentions)
D8 diffractometer, by Bruker (1 mentions)
Leo 1550, by Zeiss (1 mentions)
Jsm 7600f, by JEOL (1 mentions)
Tecnai f20, by Thermo Fisher Scientific (1 mentions)
Miniflex 600, by Rigaku (1 mentions)
Xdr 7000, by Shimadzu (1 mentions)
Irtracer 100, by Shimadzu (1 mentions)
Smartlab, by Rigaku (1 mentions)
Labram hr 800 micro raman spectrometer, by Horiba (1 mentions)
Smartlab se, by Rigaku (1 mentions)
Su8020 microscope, by Hitachi (1 mentions)
Jem 2100f microscope, by Hitachi (1 mentions)
10 protocols using epsilon 1
1
Elemental Composition of Rice Husk Extract
2
Elemental Analysis of Combustion Residues
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The X-ray fluorescence (FRX) analysis was performed on the samples ashes generated in a combustion process of ruminal material mixed with natural gas (50/50 natural gas/rumen mixture). The samples were taken from the combustion chamber and the chimney, and analyzed in a Panalytical Epsilon 1 equipment, which has a 100 KV X-ray lamp and Germanium detector. The equipment was calibrated for each of the reported elements. Using this calibration and the intensities obtained by subjecting the samples to fluorescence, the concentrations of the elements were determined, which are reported in percentage.
3
Characterization of Pt-based Catalysts
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The UV–vis spectra
of the compounds were studied using a JASCO/V-650 (190–900
nm) UV–vis spectrophotometer, taking the dimethylformamide
solution of the compounds. Fluorescence studies were done in a JASCO/FP-6300
(190–900 nm) fluorescence spectrometer. Powder XRD was studied
with Rigaku Ultima IV X-ray diffractometer with Cu Kα radiation
(λ = 1.5418 Å). A typical scan was performed at a scan
rate of 1° min–1 with a step size of 0.02°.
High-resolution TEM, EDX analysis, and bright-field imaging and mapping
of Pt–PTP and Pt–TiO2–PTP were performed
on a UHR-FEG-TEM (JEOL, JEM 2100) instrument at 200 kV. Water dispersions
of the samples were casted on a 200-mesh Cu-grid for TEM. FESEM imaging
and EDX analysis were performed by FEI, Apreo S with a 20 kV operating
voltage by taking a small amount of methanol-dispersed sample drop
casted on a silicon wafer. The loading of Pt in the synthesized catalysts
was monitored by energy-dispersive XRF (Epsilon 1; PANalytical). The
Raman spectra were recorded by a UniRAM 3300 Raman microscope with
a laser wavelength of 532 nm.
of the compounds were studied using a JASCO/V-650 (190–900
nm) UV–vis spectrophotometer, taking the dimethylformamide
solution of the compounds. Fluorescence studies were done in a JASCO/FP-6300
(190–900 nm) fluorescence spectrometer. Powder XRD was studied
with Rigaku Ultima IV X-ray diffractometer with Cu Kα radiation
(λ = 1.5418 Å). A typical scan was performed at a scan
rate of 1° min–1 with a step size of 0.02°.
High-resolution TEM, EDX analysis, and bright-field imaging and mapping
of Pt–PTP and Pt–TiO2–PTP were performed
on a UHR-FEG-TEM (JEOL, JEM 2100) instrument at 200 kV. Water dispersions
of the samples were casted on a 200-mesh Cu-grid for TEM. FESEM imaging
and EDX analysis were performed by FEI, Apreo S with a 20 kV operating
voltage by taking a small amount of methanol-dispersed sample drop
casted on a silicon wafer. The loading of Pt in the synthesized catalysts
was monitored by energy-dispersive XRF (Epsilon 1; PANalytical). The
Raman spectra were recorded by a UniRAM 3300 Raman microscope with
a laser wavelength of 532 nm.
4
Characterization of Calcium Phosphate Particles
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X-ray diffraction (XRD) measurements were conducted by using a D8 diffractometer (Bruker, USA) with Cu Kα1 radiation (λ = 1.5418 Å). The step size was 0.02° and the scan speed was 2 s per step. A scanning electron microscope (SEM, LEO 1550, Zeiss, Germany) was used to analyze the morphologies of synthesized particles. The samples were coated with a thin gold/palladium layer to avoid surface charging. The elemental composition of the samples was analyzed on an X-ray fluorescence spectrometer (XRF, Epsilon 1, PANalytical, the Netherlands). The calcium phosphate particles were pressed to form a thin disc before XRF measurement.
5
Characterization of Synthesized Materials
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The crystal structures of all synthesized materials were characterized by X-ray diffraction (XRD) (MiniFlex600; Rigaku, Tokyo, Japan) using a monochromatic Cu-Kα radiation source (λ = 1.541862Å). XRD patterns were recorded from 20 to 80° with a step size of 0.02° at the scan rate of 10 °/min. Transmission electron microscopy (TEM) (JEM-200FX, JEOL, Tokyo, Japan), high-angle annular dark-field scanning transmission electron microscopy (HAADF-STEM) (Tecnai F20, Thermo Fisher Scientific, Waltham, MA, USA), and field emission scanning electron microscopy (FE-SEM) (JSM 7600 F, JEOL, Tokyo, Japan) were used for morphological analysis of the samples. The loading amounts of Pt on ZnO were determined by X-ray fluorescence (XRF) analysis (Epsilon 1, Malvern Panalytical, Malvern, UK).
6
Legume Flour Elemental Analysis
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For this identification and quantification, 3 g of the different legume flours were placed in the sample cup of an X-Ray Fluorescence (XRF) Spectrometer (Epsilon 1, Malvern Panalytical, Madrid, Spain). The patterns were interpreted with the Omniam software.
7
Elemental Composition Analysis of EBMW
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The elemental makeup of EBMW formulations (plain and loaded with bacteriophage cocktail at MOI 1000) was determined using an EDXRF spectrometer (model Epsilon 1, Malvern Panalytical, Cambridge, UK) equipped with a 5 W, 10–50 kV, Ag anode X-ray tube, with energy resolution of 125 eV, filters of Ag, Cu, Ti, and Al for the X-ray beams, and a high-resolution 25 mm2 silicon drift detector (SDD) operating at Patm. All tests were performed with a measuring timeframe of 300 s using atmospheric air, and the spectra were obtained sequentially from 0 keV to 30 keV (resolution of 0.02 keV).
8
Characterization of Biochar Adsorption Capacity
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The biochar with the best adsorption result in the pilot test was characterized. The surface of the samples was analyzed by Scanning Electron Microscopy (SEM) (JEOL, JSM-IT200A) at 15 keV. The metallization process with gold (JEOL, Smart Coater) was carried out for a better sample scan. X-ray Fluorescence (XRF) (Malvern Panalytical, Epsilon1) was performed to analyze the composition of the material.
The Fourier transform infrared spectroscopy (FTIR) (IRTracer-100 Shimadzu) using attenuated total reflectance (ATR) analysis to determine the functional groups in the biochar and the spectra were generated in the range of 2000 to 400 cm−1.
The superficial area of the biochar was estimated by the analyzer Quantachrome NOVA 4200e by X-Ray Diffraction (XRD) (Shimadzu XDR7000), using a CuK α tube (λ = 1.5406 A) at 40 kV and 30 mA. The scan range was from 5° to 85° with a step size of 0.02° per second (raw data in theSupplementary Material ).
The Fourier transform infrared spectroscopy (FTIR) (IRTracer-100 Shimadzu) using attenuated total reflectance (ATR) analysis to determine the functional groups in the biochar and the spectra were generated in the range of 2000 to 400 cm−1.
The superficial area of the biochar was estimated by the analyzer Quantachrome NOVA 4200e by X-Ray Diffraction (XRD) (Shimadzu XDR7000), using a CuK α tube (λ = 1.5406 A) at 40 kV and 30 mA. The scan range was from 5° to 85° with a step size of 0.02° per second (raw data in the
9
Characterization of SnO2 Nanostructures
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Transmission electron microscopy (TEM) and scanning electron microscopy (SEM) images were acquired using a JEOL JEM-2100F microscope and a Hitachi SU8020 microscope, respectively. Energy-dispersive X-ray spectroscopy (EDX) were performed with an Oxford INCA X-Max 80 EDX spectrometer attached to the TEM instrument. X-ray diffraction (XRD) patterns were recorded using Rigaku SmartLab and Rigaku SmartLab SE diffractometers with nickel-filtered Cu Kα radiation (X-ray wavelength: 1.5418 Å). The crystallite sizes in SnO2 samples were determined using Scherrer's equation based on peaks at 2θ = 26.5° in the XRD profiles. X-ray fluorescence (XRF) analyses were performed using a Malvern Panalytical Epsilon 1. Inductively coupled plasma optical emission spectroscopy (ICP-OES) was performed using a Hitachi High-Tech Science PS3520UV-DD spectrometer. Nitrogen adsorption/desorption isotherms were obtained with a BELSORP-mini X and BELSORP-mini II. Specific surface areas were calculated by the Brunauer–Emmett–Teller (BET) method. Electrical resistance values were measured with a KEITHLEY source mater (model 2450) based on the four-terminal sensing technique under a pressure of 60 MPa using an 8 mg sample size. Microscopic Raman spectroscopy was performed using Horiba LabRAM HR-800 micro-Raman spectrometer with a laser excitation wavelength of 532.08 nm.
10
Quantifying Mineral Content in Flours
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X-ray fluorescence spectrometry (XRF) is a non-destructive analytical technique used to obtain elemental information on different types of materials. We placed 1 g of the flours in an energy dispersive X-ray fluorescence spectrometer (ED-XRF) (Epsilon 1, Malvern Panalytical, Madrid, Spain) to determine the mineral content of each flour. The mineral content analysis was performed using the Omnian® software for a period of 20 min per sample.
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