Lambda 365 spectrometer
The Lambda 365 spectrometer is a UV-Vis spectroscopy instrument designed for accurate and precise absorbance measurements. It features a dual-beam optical system and a high-resolution monochromator to provide reliable and reproducible data across a wide wavelength range.
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10 protocols using lambda 365 spectrometer
Characterization of Nanomaterials using Electron Microscopy and Spectroscopy
Comprehensive Characterization of Novel Materials
Structural and Spectroscopic Analysis of MIPs and NIPs
Structural Characterization of Organic Compounds
Spectroscopic Characterization of Luminescent Materials
recorded on a PerkinElmer Lambda 365 spectrometer. Fluorescence measurements
were recorded on an Edinburgh Instruments FLS980 spectrometer equipped
with a PMT 400 detector. Photoluminescence quantum yields were measured
in accordance with IUPAC methodology25 (link) against
a coumarin 102 dye solution in ethanol (purity >99.8%) at an excitation
wavelength of 387 nm (OD at 387 nm for all samples ∼0.1). Integrated
emission intensities were corrected using a detector calibration curve.
Measuring the coumarin 102 quantum yield in an integrating sphere
in the same setup gave a value of 99%, but to calculate the quantum
yield, the literature value of 95% was considered for the quantum
yield of coumarin 102.26 (link) Additionally,
a typical in situ HF + ZnCl2 treated InP sample was measured
in an integrating sphere in the same instrument to have a PLQY of
84% (
obtained in the dye measurements. PL decay traces were collected on
a Edinburgh Instruments Lifespec TCSPC setup with a 400 nm pulsed
laser. The emission was measured at 540 nm. TRPL traces were fitted
with a biexponential fitting curve, after which intensity-weighted
average lifetimes were calculated by the following equation: τave = (A1τ12 + A2τ22)/(A1τ1 + A2τ2), where An and τn are the nth amplitude and lifetime parameters
obtained from the biexponential fit.27 (link)
Characterization of Polymer Samples
Characterization of Chemical Compounds
Crystallographic Behavior of TiO2 Thin Films
behavior result from variations in substrate temperature affecting
the spatial lattice of TiO2 deposited through both spraying
and sputtering techniques. These changes were explored using (XRD)
X-ray diffraction, employing a Bruker D8 Discover X-ray diffractometer
with a copper source (40 kV, 40 mA) and a 1D detector in Bragg–Brentano
geometry. For an investigation into surface morphologies, field emission
scanning electron microscopy (FESEM) was employed. Specifically, a
JEOL 7800F FEGSEM equipped with an Oxford Instrument X-MaxN energy
dispersion spectra (EDS) detector featuring a 50 mm2 window
was utilized. The chemical composition of the thin films was analyzed
through X-ray photoelectron spectroscopy, employing the Kratos Axis
Supra instrument with a monochromatic Al K X-ray source operating
at 225 W (15 mA emission current). This analysis was conducted to
identify the presence of elements and their oxidation states. To determine
the thickness of the produced thin films, an Ambios XP2 surface profiler
was employed. The optical absorption characteristics of the photoactive
layers WO3, BiVO4, with passivation layers were
assessed using a PerkinElmer Lambda 365 spectrometer.
Spectroscopic Characterization of DNIC Complexes
at X-band using a Bruker EMXmicro-6/1/S/L spectrometer equipped with
a Bruker E4119001 super high sensitivity cavity. X-band EPR spectra
were obtained with a microwave power of 0.6456–0.6348 mW, frequency
at 9.41 GHz, conversion time of 66.68 ms, receiver gain of 30, and
modulation amplitude of 10.0 G at 100 kHz. UV–vis spectra were
recorded on a PerkinElmer Lambda 365 spectrometer. Fourier transform
infrared (FT-IR) spectra were recorded using a sealed solution cell
(0.1 mm, CaF2 windows). Reactions of dinuclear
Trace 1300 Gas Chromatograph in combination with a mass spectrometer
with a 5MS column. The confocal microscopic images were recorded using
ZEISS LSM 780 or Leica TCS–SP5-X AOBS confocal microscope systems.
The absorbance of the assay was recorded using a microplate reader
SpectraMax iD3, Molecular Devices, San Jose, CA.
Electrode Characterization and Mechanical Testing
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