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10 protocols using lambda 365 spectrometer

1

Characterization of Nanomaterials using Electron Microscopy and Spectroscopy

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Scanning electron microscope (TEM) images were taken through a TSM-7900F electron microscope (JEOL Ltd., Tokyo, Japan). Transmission electron microscopy (TEM) and High resolution transmission electron microscope (HRTEM) images were taken through a JEM−2010 transmis XCsion electron microscope with an accelerating voltage of 200 kV (JEOL Ltd., Tokyo, Japan). Ultraviolet-visible absorption (UV-Vis) spectroscopy was obtained by a PerkinElmer Lambda 365 spectrometer (Shimfusa, Japan) with a wavelength interval of 5 nm. Fourier transform infrared (FT−IR) spectroscopy was performed using a Nicolet 5700 FT−IR spectrometer (Thermo Fisher Scientific, Waltham, MA, USA). X-ray photoelectron spectroscopy (XPS) was carried out using a Thermo ESCALAB−250 (Thermo Fisher Scient-ific, Waltham, MA, USA). The fluorescent spectrum was measured by an F−2700 spectrophotometer (Hitachi, Japan). Energy dispersive X-ray spectrometry (EDS) and EDS mapping elemental analysis were measured by an Ultim Extreme detector (Oxford Instruments Technology, Shanghai, China).
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2

Comprehensive Characterization of Novel Materials

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Ultraviolet-visible (UV–Vis) analyses were performed by using a Lambda 365 spectrometer (scanning rate 240 nm/min, Perkin-Elmer, Waltham, MA, USA). The Fourier transform infrared (FTIR) spectra of the samples were recorded by a Nicolet 6700 spectrometer (Thermo-Fisher, Waltham, MA, USA). Transmission electron microscopy (TEM) images were obtained with a TH7700 microscope (JEOL, Tokyo, Japan) with an accelerating voltage of 200 kV. Atomic force microscopy (AFM) images were acquired with a NanoWizard 3 atomic force microscope (JPK Instruments, Berlin, Germany). Scanning electron microscopy (SEM) images were obtained with a JSM-6700F microscope (JEOL, Tokyo, Japan). The resistances were detected by a modified multimeter whose probe head was shaped into a pointed needle with a flat elliptical surface.
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3

Structural and Spectroscopic Analysis of MIPs and NIPs

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The phase compositions of MIPs and NIPs samples were analyzed using powder X-ray diffraction patterns (XRD, Shimadzu, Lab XRD-6000, Japan) with Cu Kα radiation (λ = 0.154 Å). Field emission scanning electron microscopic (FESEM) images were collected using a Nova NanoSEM 450 scanning electron microscope (FEI, USA). Fourier transform infrared (FT-IR) spectroscopy was performed using a Frontier infrared spectrometer (PerkinElmer, USA) over the range of 500–4000 cm−1 with KBr pellets. Thermogravimetric analysis (TGA) was carried out from 30 to 800 °C at a heating rate of 10 °C min−1 in an atmosphere of nitrogen using a TGA 4000 Thermal Analyzer (PerkinElmer, USA). UV-vis adsorption spectra were recorded using a Lambda 365 spectrometer (PerkinElmer, USA). The real urine samples were tested using an Shimadzu LC-20A HPLC system equipped with a diode array inspection (DAD) system in the experiment.
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4

Structural Characterization of Organic Compounds

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1H NMR and 13C NMR spectra were recorded on a 400 MHz Bruker Biospin Avance III spectrometer or a 400 MHz JEOL JNM-ECZ400S spectrometer. The chemical shifts (δ) for 1H NMR spectra, given in ppm, are referenced to the residual proton signal of the deuterated solvent. Crystallographic data was collected on a Mercury single crystal diffractometer at room temperature. The structures were solved with direct methods by using OlexSys or SHELXS-97 and refined with the full-matrix least-squares technique based on F2. The UV-vis spectra were measured on a PerkinElmer Lambda 365 spectrometer. All other reagents were obtained from commercial sources and were used without further purification, unless indicated otherwise.
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5

Spectroscopic Characterization of Luminescent Materials

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UV–vis spectra were
recorded on a PerkinElmer Lambda 365 spectrometer. Fluorescence measurements
were recorded on an Edinburgh Instruments FLS980 spectrometer equipped
with a PMT 400 detector. Photoluminescence quantum yields were measured
in accordance with IUPAC methodology25 (link) against
a coumarin 102 dye solution in ethanol (purity >99.8%) at an excitation
wavelength of 387 nm (OD at 387 nm for all samples ∼0.1). Integrated
emission intensities were corrected using a detector calibration curve.
Measuring the coumarin 102 quantum yield in an integrating sphere
in the same setup gave a value of 99%, but to calculate the quantum
yield, the literature value of 95% was considered for the quantum
yield of coumarin 102.26 (link) Additionally,
a typical in situ HF + ZnCl2 treated InP sample was measured
in an integrating sphere in the same instrument to have a PLQY of
84% (Figure S19), confirming the values
obtained in the dye measurements. PL decay traces were collected on
a Edinburgh Instruments Lifespec TCSPC setup with a 400 nm pulsed
laser. The emission was measured at 540 nm. TRPL traces were fitted
with a biexponential fitting curve, after which intensity-weighted
average lifetimes were calculated by the following equation: τave = (A1τ12 + A2τ22)/(A1τ1 + A2τ2), where An and τn are the nth amplitude and lifetime parameters
obtained from the biexponential fit.27 (link)
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6

Characterization of Polymer Samples

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1H NMR spectra of samples were performed on a 400 MHz NMR instrument (AVANCE III HD 400 MHz, Swiss Bruker, Brooke, Switzerland) and tetramethylsilane was used as an internal standard in deuterated chloroform (CDCl3). The ultraviolet-visible (UV-vis) spectra were recorded on a PerkinElmer Lambda 365 spectrometer (PerkinElmer, Waltham, MA, USA). The molecular weight and molecular weight distribution were conducted on an Agilent 1260 HPLC system (Agilent Technologies Inc., Santa Clara, CA, USA), tetrahydrofuran (THF) was used as eluent at 20 °C at a flow rate of 0.5 mL/min while using a refractive index (RI) detector and polystyrene calibration. The photo-liquefied photos were acquired by the microscope (XP-300C) (Shanghai Caikon Optical Instrument Co., Ltd. Shanghai, China). The ultraviolet light source is provided by Mightex (Mightex, Toronto, Ont., Canada).
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7

Characterization of Chemical Compounds

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1H NMR and 13C NMR spectra were recorded on a 400 MHz Bruker Biospin avance III spectrometer. Deuterated reagents for characterization and in situ reactions were purchased from Sigma-Aldrich Chemical Co. and Cambridge Isotope Laboratories, Inc. (purity ≥99.9%). All other reagents were obtained from commercial sources and were used without further purification, unless indicated otherwise. The chemical shifts (δ) for 1H NMR spectra, given in ppm, are referenced to the residual proton signal of the deuterated solvent. Mass spectra were recorded on a Bruker IMPACT-II or ThermoScientific LCQ Fleet spectrometer. Crystallographic data was collected on a Mercury single crystal diffractometer at room temperature. The structures were solved with direct methods by using OlexSys or SHELXS-97 and refined with the full-matrix least-squares technique based on F2 by using the OlexSys or SHELXL-97. The UV-Vis spectra were recorded on a Perkin-Elmer Lambda 365 spectrometer. TEM images were obtained on a Tecnai F20 Field Emission transmission electron microscope. SEM images were obtained on a SU-8010 Field Emission scanning electron microscope. The UV and visible light irradiation experiments were carried out on a CEL − HXF 300 xenon lamp with bandpass filters at 313 ± 10 nm (2.6 W) and 650 ± 10 nm (16.6 W), respectively.
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8

Crystallographic Behavior of TiO2 Thin Films

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The changes in crystallographic
behavior result from variations in substrate temperature affecting
the spatial lattice of TiO2 deposited through both spraying
and sputtering techniques. These changes were explored using (XRD)
X-ray diffraction, employing a Bruker D8 Discover X-ray diffractometer
with a copper source (40 kV, 40 mA) and a 1D detector in Bragg–Brentano
geometry. For an investigation into surface morphologies, field emission
scanning electron microscopy (FESEM) was employed. Specifically, a
JEOL 7800F FEGSEM equipped with an Oxford Instrument X-MaxN energy
dispersion spectra (EDS) detector featuring a 50 mm2 window
was utilized. The chemical composition of the thin films was analyzed
through X-ray photoelectron spectroscopy, employing the Kratos Axis
Supra instrument with a monochromatic Al K X-ray source operating
at 225 W (15 mA emission current). This analysis was conducted to
identify the presence of elements and their oxidation states. To determine
the thickness of the produced thin films, an Ambios XP2 surface profiler
was employed. The optical absorption characteristics of the photoactive
layers WO3, BiVO4, with passivation layers were
assessed using a PerkinElmer Lambda 365 spectrometer.
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9

Spectroscopic Characterization of DNIC Complexes

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All of the EPR measurements were performed
at X-band using a Bruker EMXmicro-6/1/S/L spectrometer equipped with
a Bruker E4119001 super high sensitivity cavity. X-band EPR spectra
were obtained with a microwave power of 0.6456–0.6348 mW, frequency
at 9.41 GHz, conversion time of 66.68 ms, receiver gain of 30, and
modulation amplitude of 10.0 G at 100 kHz. UV–vis spectra were
recorded on a PerkinElmer Lambda 365 spectrometer. Fourier transform
infrared (FT-IR) spectra were recorded using a sealed solution cell
(0.1 mm, CaF2 windows). Reactions of dinuclear DNIC–COOH/DNIC–COOMe with O2 in the presence of DTBP were characterized using
Trace 1300 Gas Chromatograph in combination with a mass spectrometer
with a 5MS column. The confocal microscopic images were recorded using
ZEISS LSM 780 or Leica TCS–SP5-X AOBS confocal microscope systems.
The absorbance of the assay was recorded using a microplate reader
SpectraMax iD3, Molecular Devices, San Jose, CA.
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10

Electrode Characterization and Mechanical Testing

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FT-IR spectra were recorded on a PerkinElmer Spectrum Two ATR spectrometer. UV-vis spectra were recorded on a PerkinElmer Lambda 365 spectrometer. Scanning Electron Microscopy (SEM) was performed using a JEOL JSM-7000F instrument. To see the surface morphology, the cycled Si electrodes were washed with dimethyl carbonate before being imaged. For evaluating the mechanical properties of the electrodes with various polymer binders, the prepared electrodes were each cut into rectangular shapes (1.2 cm × 3.0 cm) and attached to 12-mm-wide 3 M tape. The peel strength of each tested electrode specimen was then recorded with a universal testing machine (UTM, Shimadzu EZ-L) by pulling the tape at a constant displacement rate of 30 mm min−1.
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