Sputter coater
The Sputter Coater is a laboratory equipment used to apply a thin, uniform metallic coating on various samples. It utilizes a sputtering process to deposit the coating material onto the sample surface. The core function of the Sputter Coater is to prepare samples for further analysis or imaging techniques that require a conductive surface.
Lab products found in correlation
11 protocols using sputter coater
Scanning Electron Microscopy of Cell Morphology
SEM Analysis of Peptide-Treated HCC Cells
Characterize NLC Morphology by SEM
Antibacterial Efficacy of Terminalia ferdinandiana
SEM Sample Preparation Protocol
Characterisation of Polymer Particles
SEM Observation of Cell Cultures
Nanoelectrospray Ionization Protocol
these experiments, LESA microextraction was followed by sample
collection in a well plate. The sample was then loaded into a gold-coated
borosilicate nanoelectrospray emitter, i.e., the LESA sampling and
ionization processes were decoupled. These experiments are referred
to as “nanoESI” throughout this Article. Details of
the microextraction are given in the
Borosilicate glass capillaries were prepared
in house using a P-1000 pipette puller (Sutter Instrument) before
coating with gold using a sputter coater (Agar Scientific Ltd.).
Sample-loaded tips were inserted into a nanospray ion source equipped
with the static spray option (Thermo) attached to either of the mass
spectrometers described below. The electrospray voltage for the tips
was typically in the range of 1.0–1.2 kV and performed with
no additional backing pressure. The use of borosilicate emitters improved
nanoelectrospray stability, duration, and signal intensity when compared
with that of chip-based nanoESI. This observation can be attributed
to the narrower spray orifice (1–2 μm) and the tapered
geometry of the borosilicate emitter versus the square-cut geometry
of the chip-based nanoESI emitters.33 (link)
Particle Morphology Analysis by SEM
Characterization of Glass-Ceramic Microstructure
Specimens were gold coated using a sputter coater (Agar Scientific Ltd., UK) for 30 s at 40 mA and imaged using a field emission scanning electron microscope (FEI Inspect F, Hillsboro, Oregon, USA), using secondary electron imaging. Quantitative image analysis (Sigma Scan Pro 5.0, Systat Software, Inc., Chicago, IL, USA) was used on the SEM photomicrographs to ascertain (× 3500 magnification, area =2255 μm 2 ) the particle size and area fraction.
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