X-ray diffraction measurements were carried out with a Siemens D-5000 diffractometer.
AFM images were obtained using a Park NX10 system using PPP-NCHR tips (Nanosensors) in noncontact mode and applying adaptive scan rate to slow down scan speed at crystallite borders. Subsequent data analysis was done using the Gwyddion software. In order to calculate the grain sizes, a dedicated Gwyddion tool has been used. In particular, setting a height threshold value, this tool can recognize different grains laying in the same thin film.