Jxa 8200 superprobe
The JXA 8200 Superprobe is an electron probe microanalysis (EPMA) instrument designed for high-precision elemental analysis of solid samples. It features a state-of-the-art electron optical system, multiple wavelength-dispersive X-ray spectrometers, and advanced data processing capabilities for quantitative analysis of a wide range of materials.
Lab products found in correlation
9 protocols using jxa 8200 superprobe
Morphological Characterization of EKL/PVP Nanostructures
Comprehensive Characterization of Semiconductor Thin Films
Garnet Elemental Composition Analysis
Quantitative Mineral Chemistry Analysis
Geochemical Analysis of Melt Inclusions
Elemental Composition Analysis of Enamel and Rostrum
Quantitative Electron Microprobe Analysis
Analytical Techniques for Trace Fossil Analysis
Fossil Concretion Thin Section Analysis
This article is protected by copyright. All rights reserved Microprobe Facility. Thin sections were first photographed on a Zeiss AX10 followed by targeted mineral identification on a JEOL-JXA-8200 Superprobe at a 2-micron aperture.
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