Nicolet 5700 spectrometer
The Nicolet 5700 spectrometer is a Fourier-transform infrared (FTIR) spectroscopy instrument designed for analytical applications. It provides high-resolution infrared spectral data for identifying and characterizing organic and inorganic materials. The Nicolet 5700 spectrometer is capable of analyzing solid, liquid, and gas samples.
Lab products found in correlation
47 protocols using nicolet 5700 spectrometer
Infrared Structural Analysis of α-Synuclein
Spectroscopic Characterization of Compounds
Honeywell, Alfa Aesar, and Sigma-Aldrich and used without further
purification. Solvents (reagent grade) were purchased from Honeywell,
VWR, and Merck and dried by using standard techniques when required.
Manipulations were performed using standard Schlenk techniques under
a dry dinitrogen atmosphere. Elemental analyses were performed with
a CHNS/O PE 2400 series II CHNS/O elemental analyzer (T = 925 °C). FT-IR spectra were recorded with a Thermo-Nicolet
5700 spectrometer at room temperature: KBr pellets with a KBr beam
splitter and KBr windows (4000–400 cm–1,
resolution 4 cm–1) were used. Absorption spectra
were recorded at 25 °C in a quartz cell of 10.00 mm optical path
with either a Thermo Evolution 300 (190–1100 nm) spectrophotometer
or an Agilent Cary 5000 UV–vis–NIR (190–2000
nm) dual-beam spectrophotometer. Absorption spectra were decomposed
into their constituent Gaussian peaks using the Specpeak 2.065 (link) and Fityk 1.3.166 (link) programs. The Crystallographic Structural Database was accessed
by using CCDC ConQuest 2020.1.67 (link)
FTIR Analysis of α-Synuclein Aggregation
FTIR Spectroscopy Characterization
Characterization of Organic Compounds
Characterization of Synthesized Dense BGN and MBGN
Comprehensive Characterization of LDH Precursors
The scanning electron microscopic (SEM) images were obtained using a Cambridge Scan 360 SEM operating at 1 kV and a Zeiss supra 55 FEG-VP operating at 3 keV. The samples were mounted on conductive carbon adhesive tabs for imaging.
Structural Analysis of Heparin Samples
Comprehensive Characterization of Chemical Compounds
Comprehensive Characterization of Graphene-Based Materials
used was a Horiba LabRAM HR Evolution system (λ = 633 nm) with
an 1800 lines/mm grating. The laser power was kept below 1 mW to avoid
damaging the samples. The polarization of the incident light was always
parallel to the deformation direction. A scanning electron microscope
(SEM, Tescan Mira 3 FEGSEM) was employed to characterize the morphology
of fibers coated with the graphene-based materials. All the specimens
were gold-coated before imaging. Fourier-transform infrared (FT-IR)
spectra were obtained in the transmission mode by using a Nicolet
5700 spectrometer (ThermoFisher Scientific Inc.). X-ray diffraction
patterns (XRD) were obtained using a PANalytical X’Pert X-ray
diffractometer (Philips) equipped with a Cu Kα radiation source
(λ = 1.542 Å). An X-ray photoelectron spectroscope (XPS)
equipped with a monoenergetic Al Kα X-ray source at 20 eV pass
energy with a step size of 100 meV was used. The morphology of the
graphene platelets was investigated using a NanoWizard atomic force
microscope (AFM) from JPK Instruments (Germany). Before imaging, a
small amount of graphene powder was dissolved in a mixture of isopropanol
and deionized water with a volume fraction of 1:1, which was then
sonicated for 2 h and drop-cast onto silicon wafers to be imaged.
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