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Attenuated total reflectance attachment

Manufactured by Shimadzu
Sourced in Japan

The Attenuated Total Reflectance (ATR) attachment is a sampling accessory used in conjunction with Fourier Transform Infrared (FTIR) spectrometers. The core function of the ATR attachment is to enable the analysis of solid, liquid, and paste samples without the need for sample preparation. The ATR attachment utilizes the principle of total internal reflection to obtain the infrared spectrum of a sample in direct contact with the ATR crystal surface.

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2 protocols using attenuated total reflectance attachment

1

Characterizing Carbonate Materials via FTIR

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FTIR spectroscopy
was used to probe several characteristic vibrational modes in carbonate
materials. Measurements were conducted in an IRSpirit FTIR spectrophotometer
with an attenuated total reflectance attachment from Shimadzu under
ambient conditions. The FTIR measurements were conducted between 4000
and 650 cm–1. The presented data are an average
of 10 consecutive scans.
Samples for FTIR were prepared in the
TGA 851e to ensure the precise preparation conditions, following a
similar procedure to earlier TGA measurements. First, approximately
6 mg of powder was calcined in dry air in situ for 30 min at 190 °C.
Subsequently, the temperature was lowered to 40 °C and equilibrated
in dry air for another 30 min. After that, the humid air with desired
partial vapor pressure was introduced into the system and held constant
for at least 2 h. Finally, the sample was moved to the FTIR spectrophotometer
right after the measurement had ended.
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2

Characterizing Silica Particle Surface

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Surface functionality of bare and mPEG-grafted silica particles was characterized using a Fourier transform infrared spectrometer with an attenuated total reflectance attachment (Shimadzu, Japan). The FTIR spectra were recorded at a resolution of 4 cm−1 over 64 scans in the range of 4000–400 cm−1.
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