Cross beam 1540esb electron microscope
The Cross-Beam 1540EsB electron microscope is a high-resolution imaging and analysis tool designed for a variety of applications. It features a dual-beam configuration that combines a field-emission scanning electron microscope (FE-SEM) with a focused ion beam (FIB) column, enabling both high-resolution imaging and precise sample preparation.
3 protocols using cross beam 1540esb electron microscope
Scanning Electron Microscopy of Cell Morphology
SEM Imaging of Coated Specimens
SEM Sample Preparation Protocol
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