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Ppp rt nchr

Manufactured by Nanosensors
Sourced in Switzerland

The PPP-RT-NCHR is a laboratory equipment product. It is a non-contact high-resolution atomic force microscope (AFM) cantilever. The product is designed for research and analysis applications.

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2 protocols using ppp rt nchr

1

Characterization of Gold Nanoslit Arrays

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Figure 1a shows the optical picture of a gold capped EC-SPR sensor. The surface morphology of the gold nanoslit arrays was determined using a Helios NanoLab 660 focused ion beam scanning electron microscope (FIB-SEM) (FEI, Hillsboro, OR, USA). The characterized width using SEM for the capped gold nanoslit arrays is about 75.0 nm and the outside surface is about 417.3 nm (Figure 1b). The depth of the gold nanostructures on the COP substrate was analyzed by atomic force microscopy line scan (BioAFM NanoWizard 3, JPK, Berlin, Germany), operated in AC mode under dry conditions and using highly doped silicon to dissipate static charge tips (PPP-RT-NCHR, Nanosensors, Neuchatel, Switzerland) with a spring constant of 42 N/m and a resonant frequency of 330 kHz. Figure 1c shows the cross-sectional profile of template-stripped nanostructures. The measured height of capped gold nanoslit arrays is about 47 nm.
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2

Surface Topography Characterization of Thin Films

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The surface topography and root mean square (RMS) roughness of the S70, HS55 and S200/HS55 films were characterized by AFM. Samples were imaged in air at room temperature and humidity with a 5500 Scanning Probe Microscope (Agilent Technologies, Santa Clara, CA), operating in intermittent contact mode, typically referred to as an AC mode, with a scan range of 5 µm × 5 µm at 512 × 512 pixels and a scan rate of 0.5 Hz. The intermittent contact was selected to avoid the detachment of nanoparticles during measurement. Tapping-mode silicon cantilever probes, type PPP-RT-NCHR (NanoSensors, Neuchatel, Switzerland) with a nominal resonance frequency of 330 kHz, a nominal constant force of 42 N/m, and a curvature radius of less than 10 nm were used. Image processing and analysis, consisting of background correction, were carried out using Gwyddion 2.53 (Dept. of Nanometrology, Czech Metrology Institute, Brno, Czech Republic).
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