Tapdlc 150

We employed atomic forces microscopy (AFM) to examine the prepared samples’ surface morphology. AFM examinations of the samples were performed using MultiMode 8 (Bruker, Billerica, MA, USA). Silicon cantilevers with a spring constant of ca. 5 Nm⁻¹ (TapDLC-150, BudgetSensors, Sofia, Bulgaria) were applied for imaging in PeakForce TappingTM microscopy mode. The sample preparation procedure includes the application of 150 µL of solution on the clean mica plate, V1 grade (NanoAndMore GmbH, Wetzlar, Germany). After 10 min, the plates were rinsed with deionized water and dried under a gentle stream of argon. The data were acquired in Nanoscope 8.15 software and then analyzed with NanoScope Analysis 1.4 software (Wetzlar, Germany).

A Multimode 8 Nanoscope atomic force microscope (AFM, Bruker, Billerica, MA, U.S.A.) was used to image the samples’ surfaces. Silicon cantilevers with a spring constant of ca. 5 Nm⁻¹ (TapDLC-150, BudgetSensors, Sofia, Bulgaria) were applied for imaging in PeakForce TappingTM microscopy mode. The sample preparation procedure includes the application of 150 µL of solution on the clean mica plate, V1 grade (NanoAndMore GmbH, Wetzlar, Germany). After 10 min, the plates were rinsed with deionized water and dried under a gentle stream of argon.