The AOW samples, before and after pretreatment, were examined using a scanning electron microscope (SEM VEGAS 3 SBU, Tescan, Brno-Kohoutovice, Czech Republic) with a Quantax EDS XFlash (Bruker, Karlsruhe, Germany) detector. The samples were deposited on a double-sided conductive carbon tape on two aluminum stubs and analyzed.
Quantax eds xflash
Manufactured by Bruker
Sourced in Czechia, United States
The Quantax EDS XFlash is an energy-dispersive X-ray spectrometer (EDS) designed for elemental analysis in a scanning electron microscope (SEM) or focused ion beam (FIB) system. It provides rapid and accurate identification and quantification of elements present in a sample.
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Lab products found in correlation
2 protocols using quantax eds xflash
1
Scanning Electron Microscopy of AOW Samples
2
Characterization of Mechanically Alloyed Powders
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The MA powders and sintered alloys' phase composition was examined by an X-ray diffraction (XRD, Philips PW-3170) using Cu Kα radiation (The scanning angle was 10-90 o and the scan rate was 2 o /min). The mean crystallite size and lattice strain of the mechanically alloyed powders were calculated using the Williamson-Hall equation [14] (link), where lattice parameter was obtained from the shifts in peak positions on the XRD patterns [15] (link). The microstructure of the alloys was examined by a scanning electron microscopy (SEM, VEGA3-XMU, TESCAN, Kohoutovice, Czech Republic) equipped with an energy dispersive spectrometer (EDS, QUANTAX EDS XFlash®, Bruker, U.S.A). The density of the alloys samples was measured by Archimedes principle.
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