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Poseidon

Manufactured by Protochips
Sourced in United States

Poseidon is a versatile lab equipment product designed for in-situ liquid cell transmission electron microscopy (TEM) experiments. It provides a controlled liquid environment for the observation and analysis of dynamic processes at the nanoscale.

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2 protocols using poseidon

1

In-situ TEM/STEM Imaging and Analysis

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The STEM images were recorded for each step using FEI Tecnai G2 F20 (S)TEM equipped with a Tridium Gatan image filter operating at 200 kV, used in the high annular dark field (HADF) STEM mode. Continuous capture movies were recorded for ~3 min using a freeware screen grabber, AutoScreenRecorder (Wisdom Software) that recorded images at a rate of 8 frames per second. Determining dose-rate and critical dose on the specimen was conducted at the Center for Nanophase Materials Sciences, Oak Ridge National Laboratory with the FEI Titan-S aberration-corrected TEM/STEM equipped with a Gatan Quantum EELS and Gatan Imaging Filter (GIF), with dual-EELS and fast spectrum imaging capabilities, Gatan OneView CMOS camera with in-situ option for high-frame-rate image/video capture. Continuous capture movies were recorder using a Camtasia Studio 8.0 screen recorder and video editor software (TechSmith). The Titan-S aberration-corrected TEM/STEM operated at 300 kV and was used in the HAADF-STEM mode. The work on this instrument was performed with using a specialized liquid-flow holder (Protochips Poseidon). Data analysis was performed with ES Vision (FEI) software (ES Vision version 5.0) and OriginPro 9.0 software. Video editing was performed with BigaSoft Total Video Convertor (Bigasoft 6).
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2

Liquid-Phase Electron Microscopy Imaging

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A liquid flow TEM holder (Poseidon, Protochips Inc., NC, USA) was used to image the nanoparticles in different solvents. Liquid-phase STEM experiments were carried out using a transmission electron microscope equipped with a cold field emission gun (JEM-ARM 200F, JEOL, Japan) and a STEM probe corrector (CEOS GmbH, Germany). The electron beam energy was 200 keV. The annular dark-field (ADF) detector was used with a camera length of 8 cm, an aperture of 30 μm, and a 5C probe, resulting in a detector opening semi-angle of 43 mrad reflecting the active areas of the detector. The electron probe current Ip was 80 pA. The image series was acquired with a pixel dwell time of τ = 1 μs and an image size of 512 × 512 pixels. Depending on the magnification, the pixel size was either s = 1.3, 0.48, or 0.39 nm. The acquisition time between two consecutive recordings amounted to ν = 1.08 s. The electron flux, D, expressed in electrons per unit area per unit time was calculated from D = τ*Ip/(ν*e*s2), where e is the elementary charge.
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