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Spectra pro 2500i

Manufactured by Teledyne

The Spectra Pro 2500i is a high-performance spectrometer designed for a wide range of applications. It features a compact and robust design, advanced optical components, and a sensitive detector to provide accurate and reliable spectral analysis. The core function of the Spectra Pro 2500i is to capture and analyze the spectral characteristics of materials, enabling users to identify and quantify their chemical composition.

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9 protocols using spectra pro 2500i

1

Time-resolved Photoluminescence Decay Measurement

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To record the time-resolved
emission scan or photoluminescence decay of the samples, time-correlated
single-photon counting (TCSPC) was performed. Samples were excited
with a pulsed laser (PicoQuant LDH400 40 MHz) at 375, 407, and 470
nm, with the resulting photoluminescence decay collected on a 500
mm focal length spectrograph (Princeton Instruments, SpectraPro2500i)
with a cooled CCD camera. The instrument response was determined by
scattering excitation light into the detector using a piece of frosted
glass; a value of 265 ps was obtained. The excitation fluence for
all samples was similar to that used in transient absorption measurements
and maintained sufficiently low (∼6–12 μJ/cm2) to avoid nonlinear effects, for example, from exciton–exciton
annihilation.
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2

Structural and Optical Characterization of Thin Films

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All the samples were first characterized by X-ray diffraction (XRD) measurements. The XRD patterns were collected using a Bruker-AXS D8 Advance X-ray diffractometer equipped with Cu Kα ( λ  = 1.5418 Å) X-ray source. The measurement was performed in 2 θ mode between 10° and 50° with step size of 0.02° and the integration time of 1 s per step. The surface morphology and thickness of the films were measured using AFM (Bruker Bioscope Resolve) working in a contact mode. Temperature-dependent absorption measurement was conducted by directing the white light beam generated through a quartz-tungsten-halogen lamp on the films that were kept in a cryostat cooled by liquid nitrogen. The transmitted light was collected by a pair of lenses via an optical fiber coupled by a spectrometer (Acton, Spectra Pro 2500i) and charge coupled device (CCD) (Princeton Instruments, Pixis 400B). For each measurement, transmitted light of a fused silica was collected under the same conditions, that served as a reference.
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3

Photoluminescence characterization of semiconductors

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(Time-integrated) photoluminescence measurements were conducted by directing the excitation laser pulses to SCs or thin films. The laser pulses were generated by a 1-kHz regenerative amplifier (Coherent Libra, 800 nm, 50 fs, 4 mJ). A mode-locked Ti-sapphire oscillator (Coherent Vitesse, 80 MHz) was used for the amplifier. For 800 nm pump, the laser from the regenerative amplifier was directly used. For 400 nm, a BBO crystal was used to double the frequency of 800 nm. The photoluminescence was collected at a backscattering angle by a spectrometer (Acton, Spectra Pro 2500i) and CCD (Princeton Instruments, Pixis 400B). For circular-polarized pump and circular-polarized PL measurements, a quarter-waveplate and polarizer were placed in the path of the excitation beam and another pair of quarter-waveplate and polarizer were placed at the PL detection path. Time-resolved photoluminescence was collected using a streak camera system (Optronis Optoscope), which has an ultimate temporal resolution of 6 ps. For the temperature-dependent PL and TRPL measurements, the crystals were adhered to the cryostat (Janis) copper sample mount with silver paste. The temperature was cooled down using liquid nitrogen.
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4

Time-Resolved Photoluminescence Measurement

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Time-integrated photoluminescence measurement was conducted by directing the excitation laser pulses to thin films. The photoluminescence was measured at a backscattering angle of 145° by a pair of two lenses via an optical fiber coupled by a spectrometer (Acton, Spectra Pro 2500i) and CCD (Princeton Instruments, Pixis 400B). Time-resolved photoluminescence was collected using an Optronis Optoscope streak camera system with an ultimate temporal resolution of 10 ps.
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5

Femtosecond Spectroscopy of Thin Films

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For femtosecond optical spectroscopy, the laser source was a Coherent Libra regenerative amplifier (50 fs, 1 KHz, 800 nm) seeded by a Coherent Vitesse oscillator (50 fs, 80 MHz). 800 nm wavelength laser pulses were from the regenerative amplifier while 400 nm wavelength laser pulses were obtained with a BBO doubling crystal. 650-nm laser pulses were generated from a Coherent OPerA-Solo optical parametric amplifier. The laser pulses (circular spot, diameter 2 mm) were directed to the films. The emission from the samples was collected at a backscattering angle of 150° by a pair of lenses into an optical fiber that was coupled to a spectrometer (Acton, Spectra Pro 2500i) and detected by a charge coupled device (Princeton Instruments, Pixis 400B). TRPL was collected using an Optronis Optoscope streak camera system which has an ultimate temporal resolution of around 10 ps.
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6

Nanoparticle Scattering Spectroscopy

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An inverted optical microscope (Nikon Ti-U/E20L80) with a quartz‑tungsten-halogen white light lamp source, a 100×/0.55 oil-immersed objective lens, an optical spectrometer (Spectra Pro 2500i), and a charge-coupled device camera (Princeton Instruments PIXIS 400) was used to collect the scattering spectra from single nanoparticles. Two orthogonal slits were used to collect scattered light from either a nanoparticle or the background. All nanoparticle spectra were normalized to the averaged background profiles collected immediately next to the particle (normalized spectra = nanoparticle spectra / averaged background spectra).
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7

Time-Resolved Photophysical Characterization

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PL and TRPL measurements were performed using femtosecond excitation pulses (>50 fs) generated from a femtosecond laser system configured by Coherent Libra (50 fs; seed and amplifier integrated system) + OPerA Solo (optical parametric amplifier). The emitted light was collected at a backscattering angle by a spectrometer (Acton, SpectraPro-2500i) and charge-coupled device (CCD) (Princeton Instruments, PIXIS 400B) in PL measurements and by an Optronis OptoScope streak camera system, which has an ultimate temporal resolution of 6 ps in TRPL measurements. PLQY measurements were performed with a 473-nm continuous wave diode laser as excitation source. The PL was collected by an integrating sphere and sent to the PL detection system (Acton, SpectraPro-2500i).
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8

Steady-State and Time-Resolved PL Analysis

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Time-integrated steady-state PL from the samples was collected at the edge of the film by using a pair of lenses into an optical fiber that was coupled to a spectrometer (Acton, Spectra Pro 2500i) and detected by a charge-coupled device (Princeton Instruments, Pixis 400B). TRPL was measured using an Optronis Optoscope streak camera system.
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9

Steady-State and Time-Resolved Photoluminescence

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Time-resolved and steady-state photoluminescence of the samples excited with 600 nm pulses were collected using a backscattering geometry at an angle of ~150° by a collimating lens pair. A Coherent OPerA Solo optical parametric amplifier pumped with a Coherent Libra™ regenerative amplifier (50 fs, 1KHz, 800 nm) was used for the excitation wavelength. The steady-state photoluminescence was collected using a fibre coupled to an Acton Spectra Pro 2500i spectrometer with a Princeton Instruments PIXIS 400B CCD camera. The time-resolved photoluminescence was collected by an Acton Spectra Pro 2300i monochromator coupled to an Optronis Optoscope™ streak camera, which has a temporal resolution of ~10 ps.
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