Inca energy 200

Manufactured by Oxford Instruments

Sourced in United Kingdom

The INCA Energy 200 is an energy-dispersive X-ray (EDX) spectrometer designed for elemental analysis of materials. It provides high-resolution x-ray detection and analysis capabilities for a wide range of applications. The instrument's core function is to identify and quantify the elemental composition of samples through the measurement and analysis of characteristic X-ray emissions.

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Lab products found in correlation

Escalab 250xi, by Thermo Fisher Scientific (4 mentions) Nicolet 6700, by Thermo Fisher Scientific (3 mentions) Vsm versalab, by Quantum Design (1 mentions) X max, by Oxford Instruments (1 mentions) Jem 2100f, by JEOL (1 mentions) Da 30, by Krüss (1 mentions) Nova nano 450, by Thermo Fisher Scientific (1 mentions) Ultima 4, by Rigaku (1 mentions) 6000 diffractometer, by Shimadzu (1 mentions) Spectrum 2, by PerkinElmer (1 mentions) Evo ma10, by Zeiss (1 mentions) Miniflex x ray diffractometer, by Rigaku (1 mentions) Jsm 6610lv, by JEOL (1 mentions) K alpha x ray, by Thermo Fisher Scientific (1 mentions) Invia raman spectrometer, by Renishaw (1 mentions) Nicolet 8700, by Thermo Fisher Scientific (1 mentions) Raman station 400f, by PerkinElmer (1 mentions) Quanta 450, by Thermo Fisher Scientific (1 mentions) Smartlab, by Rigaku (1 mentions) Oca25, by Dataphysics (1 mentions)

8 protocols using inca energy 200

Nanowire Heterostructure Characterization

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Scanning electron microscopy (SEM, JEOL 5600, JEOL, Akishima, Tokyo, Japan) equipped with an energy dispersive X-ray microanalysis system (EDX, Inca Energy 200, Oxford Instruments, Abingdon, UK) was employed to perform a morphological and compositional characterization of the samples. Transmission electron microscopy (TEM, JEOL JEM 2100, JEOL, Akishima, Tokyo, Japan) suited with an EDX detector (X-MAX, Oxford Instruments, Abingdon, UK) and operating in scanning transmission mode was employed for the EDX linescan analysis of the layered core/shell nanowires hetero-structure.
The magnetic study is performed using a vibrating sample magnetometer (VSM-Versalab, Quantum Design, San Diego, CA, USA) under a magnetic field up to ±3 T and temperatures ranging from 50 K to 400 K. Furthermore, hysteresis loops of individual core/shell nanowires have been measured at room temperature (RT) by means of the magneto-optical Kerr effect using a NanoMOKE^®3 from Durham Magneto Optics Ltd. (Cambridge, UK).

García J., Manterola A.M., Méndez M., Fernández-Roldán J.A., Vega V., González S, & Prida V.M. (2021). Magnetization Reversal Process and Magnetostatic Interactions in Fe56Co44/SiO2/Fe3O4 Core/Shell Ferromagnetic Nanowires with Non-Magnetic Interlayer. Nanomaterials, 11(9), 2282.

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Characterization of Thin Film Materials

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Example 2

A benchtop X-ray diffraction (XRD) on a Rigaku MiniFlex X-ray diffractometer (Japan) using Cu Kα1 radiation (α=0.15416 nm) was used to record the XRD patterns. The thin film morphologies were examined on a dual-beam FE-SEM TESCAN Lyra 3. Elemental detection was performed using energy dispersion X-ray spectroscopy (EDX) on EDX, INCA Energy 200, Oxford Instrument. A field emission transmission electron microscope (FE-TEM) (JEOL-JEM2100F, Japan) operated at an accelerating voltage of 200 KV was employed to examine the thin film microstructure. The oxidation and chemical states of the elements were investigated with the X-ray photoelectron spectroscopy (XPS) technique (Thermo Fisher Scientific, model: ESCALAB250Xi, USA).

US11802335B1. NiPd nano-alloy film as a electrocatalyst and methods of preparation thereof (2023-10-31). KING FAHD UNIVERSITY OF PETROLEUM AND MINERALS [SA]. Inventors: Muhammad Ali Ehsan [SA], Abbas Saeed Hakeem [SA].

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Characterizing Surface Morphology and Properties

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The surface morphology of the
sheets was observed by field-emission scanning electron microscopy
(Nova Nano450, FEI, Hillsboro, OR, USA) at an acceleration voltage
of 5 kV. X-ray energy-dispersive spectroscopy (EDS; Inca Energy 200,
Oxford Instruments, Oxford, UK) was used to detect the distribution
of Ca and P elements. Fourier transform infrared spectroscopy (Nicolet
6700, Thermo Fisher Scientific, Waltham, MA, USA) was performed in
the range of 650–4000 cm^–1 at a resolution
of 2 cm^–1. The mineral phase on the substrates was
evaluated by X-ray diffraction (Ultima IV, Rigaku, Tokyo, Japan) analysis.
Hydrophilicity was measured using a contact angle goniometer (DA 30,
Krüss, Hamburg, Germany), and the average value of five specimens
per group was measured.

Zhu G.Y., Liu Y.H., Liu W., Huang X.Q., Zhang B., Zheng Z.L., Wei X., Xu J.Z, & Zhao Z.H. (2021). Surface Epitaxial Nano-Topography Facilitates Biomineralization to Promote Osteogenic Differentiation and Osteogenesis. ACS Omega, 6(33), 21792-21800.

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Comprehensive Materials Characterization

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Targets are characterized by X-ray diffractometry (XRD - Shimadzu 6000 diffractometer, CuK_α radiation) in the range of 20–80° (2θ), Scanning Electron Microscope (SEM - EVO/MA10, ZEISS, equipped with an Energy Dispersive X-ray Spectrometry system - EDS, INCA Energy 200, Oxford Instruments, UK) and Attenuated Total Reflection Fourier-transform infrared spectroscopy (FT-IR/ATR) (PerkinElmer Spectrum 2, USA), to verify the compliance to the expected composition.

Graziani G., Barbaro K., Fadeeva I.V., Ghezzi D., Fosca M., Sassoni E., Vadalà G., Cappelletti M., Valle F., Baldini N, & Rau J.V. (2021). Ionized jet deposition of antimicrobial and stem cell friendly silver-substituted tricalcium phosphate nanocoatings on titanium alloy. Bioactive Materials, 6(8), 2629-2642.

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Comprehensive Characterization of Catalyst

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The catalyst morphology was seen with a scanning electron microscope (SEM) JEOL JSM-6610LV (Japan). An energy-dispersive X-ray spectrometer (EDX, INCA Energy 200, Oxford Instruments, UK) was used to find the elemental composition of the catalyst. The crystalline structure was recorded by X-ray diffraction (XRD, Rigaku MiniFlex X-ray diffractometer (Japan)), which was used to measure the crystalline pattern of the films over a 2θ range of 20–90°. The TEM measurement analysis was performed using a JEOL-JEM2100F, Japan, operating at an acceleration voltage of 200 kV. X-ray photoelectron spectroscopy (XPS, Thermo Scientific EscaLab 250Xi, USA) with an Al Kα (1486.6 eV) source was performed to examine the chemical composition and valence states. The electron beam was calibrated with C 1s (284.6 eV) as the standard.

Ehsan M.A., Khan A., Suliman M.H, & Javid M. (2023). Facile deposition of FeNi/Ni hybrid nanoflower electrocatalysts for effective and sustained water oxidation. Nanoscale Advances, 5(18), 5122-5130.

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Comprehensive Material Characterization Techniques

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Fourier-transform infrared (FTIR) spectra were obtained using a Nicolet 8700 (Thermo Scientific, Madison, WI, USA) spectrometer, in the spectral range between 4,000 and 400 cm -1 using KBr pellets. Raman spectra were collected between 3,200 cm -1 and 100 cm -1 using an inVia Renishaw Raman spectrometer (Renishaw, Gloucestershire, UK). A 633 nm argon laser at 5% power was used as the excitation radiation source. Elemental microanalysis was obtained by Energy-dispersive X-ray spectroscopy (EDX; INCA Energy 200, Oxford Instruments, Oxfordshire, UK) coupled to scanning electron microscope (JEOL JMS 6360LV, Japan Electron Optics Laboratory, Tokyo, Japan) at 20 kV. X-ray diffraction (XRD) patterns were obtained using a Bruker D8-Advance Bragg diffractometer (Bruker, Billerica, MA, USA) in the 2θ range from 5° to 60°, with an interval time lapse of 1 s and a step size of 0.02º. X-ray photoelectron spectroscopy (XPS) was conducted in a Thermo Scientific K-Alpha X-ray (Thermo Fisher Scientific, Orion, MA, USA) photoelectron spectrometer (with a monochromatic source of Al Kα with an energy of 1486.6 eV) on etched (Ar ions for 30 s) samples. Transmission electron microscopy (TEM) was conducted with a JEOL JEM-ARM200F (Japan Electron Optics Laboratory) with 200 keV at a 50 μm opening at 2×10 -5 Pa vacuum. The samples were deposited in a platinum grid covered with Formvar film.

Aguilar-Perez D., Vargas-Coronado R., Cervantes-Uc J.M., Rodriguez-Fuentes N., Aparicio C., Covarrubias C., Alvarez-Perez M., Garcia-Perez V., Martinez-Hernandez M, & Cauich-Rodriguez J.V. (2020). Antibacterial activity of a glass ionomer cement doped with copper nanoparticles. Dental materials journal, 39(3).

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Comprehensive Material Characterization Protocol

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The cross‐sectional images and top‐surface view images were examined by scanning electron microscopy (SEM, FEI Quanta 450). The element distribution was examined by the energy dispersion spectroscopy (EDS, Oxford Instruments, INCA Energy 200). The contact angles were measured by Standard Contact Angle Goniometer (OCA25, Dataphysics). The crystal structures were characterized by X‐ray diffraction (XRD, Rigaku SmartLab). The Raman spectrum of the thin films was characterized by Raman spectrometer (Perkinelmer Raman station 400F). The FTIR spectrum was conducted by Fourier transform infrared spectrometer (Bruker Tensor 27).

Liu S., Shan Y., Hong Y., Jin Y., Lin W., Zhang Z., Xu X., Wang Z, & Yang Z. (2022). 3D Conformal Fabrication of Piezoceramic Films. Advanced Science, 9(18), 2106030.

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Characterization of FU Scaffold Materials

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Energy dispersive X-ray analysis was studied using EDX-System (INCA Energy 200, Oxford Instruments). The energy of the X-rays emitted from the samples was measured using an energy-dispersive spectrometer and the corresponding EDX spectrum was plotted using Micro-analysis suite software (Version 4.05-Oxford Instruments). The Bragg peaks XRD patterns of FU scaffold were recorded on a D8 Advance X-Ray diffractometer (Bruker-AXS, USA). The diffractometer was operated using Ni-filtered monochromatized CuKα radiation (λ = 1.54056Ǻ) at 40kV, and 40mA at 25 ºC with a scanning rate of 0.1 deg s^-1. Bragg peak diffraction patterns were plotted at the range of 10 to 80 2θº. For Raman spectroscopy (Renishaw Invia, UK), the Raman spectra were collected with laser excitation at 514 nm and an acquisition range from 200 to 1000 cm^-1. An X-ray photoelectron spectroscopy (XPS, ULVAC-PHI Quantera II) with C Kα (hν ¼ 278–298 eV), O Kα (hν ¼ 523–543 eV), Mg Kα (hν ¼ 84–104 eV), Si Kα (hν ¼ 94–144 eV), Ar Kα (hν ¼ 235–255 eV), Ca Kα (hν ¼ 341–361 eV) and Hg Kα (hν ¼ 95–105 eV) X-ray sources was utilized for FU XPS signal acquisition. The Brunauer−Emmett−Teller (BET-Autosorb iQ2) specific surface area of the FU scaffold was measured from the nitrogen adsorption-desorption isotherms.

Krishnamurithy G., Mohan S., Yahya N.A., Mansor A., Murali M.R., Raghavendran H.R., Choudhary R., Sasikumar S, & Kamarul T. (2019). The physicochemical and biomechanical profile of forsterite and its osteogenic potential of mesenchymal stromal cells. PLoS ONE, 14(3), e0214212.

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