Icp optima 2000dv

X-ray diffraction (XRD) was carried out on a Bruker Powder D8 Advance diffractometer with CuKα radiation (λ = 1.5418 Å). Field-emission scanning electron microscope (SEM) images were tested on a JEOL JSM-7600F microscope operated at 5 kV. Transmission electron microscopy (TEM) images were performed using a JEOL JEM-1400 TEM microscope working at 100 kV. The samples for TEM measurements were dispersed in ethanol ultrasonically, dropped on copper grids, and then dried at 373 K. Nitrogen adsorption–desorption characterization was evaluated on Quantachrome Autosorb-iQ instruments at 77 K liquid nitrogen. The samples were degassed at 573 K under vacuum for 10 h before testing. Diffuse reflectance ultraviolet–visible (DRUV/vis) spectra were recorded on a Shimadzu UV-2450 spectrophotometer with BaSO4 as a reference. Fourier Transform Infrared (FTIR) spectra were measured on a Shimadzu IRPrestige-21 spectrometer based on KBr pellets. Elemental analysis of Si, Ti, Na, and K was measured on a Perkin Elmer ICP Optima 2000DV (Waltham, MA, USA) inductively coupled plasma optical emission spectrometer.

Inductively coupled plasma–optical emission spectroscopy (ICP-OES) was used to determine the elemental composition. The equipment used was a Perkin Elmer ICP Optima 2000DV, with a detection limit between 0.005 and 0.01 ppm, depending upon the element. The quantitative determination of elements was carried out using a calibration curve prepared from Merck’s certified multi-elemental standard solution. It was constructed with eight calibration points in the concentration range from 0 to 8000 ppm.

Powder X-ray diffraction (PXRD) was carried out using a Bruker Powder D8 Advance diffractometer operated at 40 kV and 40 mA with CuKα radiation (λ = 1.5418 Angstrom). Diffuse reflectance ultraviolet-visible (DRUV/vis) spectra were measured on a Shimadzu UV-2450 spectrophotometer at 298 K with BaSO4 as a reference. IR spectra were measured on a Shimadzu IRPrestige-21 spectrometer as KBr pellets. Elemental analyses (Si and Ti) were measured on an inductively coupled plasma optical emission spectrometer (ICP-OES, Perkin Elmer ICP Optima 2000DV). Field-emission scanning electron microscope (SEM) images were recorded on a JEOL JSM-7600F microscope at 5 kV. Transmission electron microscopy (TEM) observations were performed using a JEOL JEM-1400 TEM microscope working at 100 kV. Particle sizes were measured on Malvern Zetasizer Nano ZS90 analyzer.