To provide insight into the chemical changes occurring over the entire dyeing process, FTIR analysis was carried out on the para-aramid samples at the different stages of treatments. Attenuated total reflection Fourier transform infrared spectroscopy (ATR–FTIR) spectra were recorded using an FTIR spectrometer (Excalibur 3100, Varian Inc., Palo Alto, CA, USA) equipped with an overhead attenuated total reflection (ATR) accessory with germanium crystal (UMA 400, Varian Inc.) and a liquid nitrogen cooled mercury cadmium telluride detector. A sample was placed on a potassium bromide (KBr) plate and pressed under the germanium crystal for scanning. Each spectrum was collected within the mid-IR region from 50–4000 cm−1 at a resolution of 4 cm−1 after averaging 128 scans. The ATR spectra of samples were presented in absorbance units after taking into account the background spectrum acquired using a blank KBr plate. Between successive measurements, the germanium ATR crystal was carefully cleaned with ethanol, rinsed with distilled water, and dried to prevent cross contamination. All the spectra were ATR-corrected using Varian Resolutions Pro software (Varian Inc., Palo Alto, CA, USA).
Excalibur 3100
Manufactured by Agilent Technologies
Sourced in United States
The Excalibur 3100 is a versatile spectroscopic instrument designed for analyzing the composition of materials. It utilizes advanced X-ray fluorescence (XRF) technology to provide rapid, non-destructive elemental analysis. The core function of the Excalibur 3100 is to perform qualitative and quantitative measurements of elements present in a wide range of sample types.
Automatically generated - may contain errors
Lab products found in correlation
Uma 400, by Agilent Technologies (2 mentions)
D8 focus, by Bruker (2 mentions)
S 4800 scanning electron microscope, by Hitachi (1 mentions)
Multi75e g, by Budget Sensors (1 mentions)
Tof sims 5, by ION-TOF (1 mentions)
Invia reflex, by Renishaw (1 mentions)
S 4800 sem, by Hitachi (1 mentions)
X ray diffractometer, by Bruker (1 mentions)
Dimension icon, by Bruker (1 mentions)
Alpha ftir spectrophotometer, by Bruker (1 mentions)
Rf 5301pc spectrofluorophotometer, by Shimadzu (1 mentions)
Spectrophotometer uv 1601pc, by Shimadzu (1 mentions)
Avance av 300, by Bruker (1 mentions)
S 4800 instrument, by Hitachi (1 mentions)
Jeol2100f microscope, by Hitachi (1 mentions)
F 4600, by Hitachi (1 mentions)
Quantum 2000 scanning esca microprobe, by Physical Electronics (1 mentions)
Su8010, by Hitachi (1 mentions)
Avance 400, by Agilent Technologies (1 mentions)
S 4800, by Hitachi (1 mentions)
14 protocols using excalibur 3100
1
FTIR Analysis of Para-Aramid Dyeing Process
2
Characterization of Nanofiber Structure and Thermal Properties
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The microstructure of the nanofibers was characterized by an S-4800 scanning electron microscope (SEM, Hitachi, Tokyo, Japan). The functional groups of the nanofibers were recorded by Fourier Transform Infrared (FTIR, Excalibur 3100, Varian, Palo Alto, CA, USA) Spectroscopy in ATR mode, and the wavelength range was 4000–600 cm−1. The functional groups in the ROX powers were also characterized by FTIR in the scanning range of 4000–400 cm−1. Differential Scanning Calorimetry (DSC, NETZSCH, Selb, Freistaat Bayern, Germany) was used to investigate the thermal properties of the samples. The samples were equilibrated at 0 °C and then heated to 200 °C at a heating rate of 10 °C/min in a nitrogen atmosphere. The thermal stability of the samples was also analyzed by thermogravimetry (TGA, NETZSCH, Selb, Freistaat Bayern, Germany) in a nitrogen atmosphere, and the sample was heated from 0 °C to 600 °C at a heating rate of 10 °C/min.
3
Multi-Spectroscopic Analysis of Material Composition
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The Raman spectra were acquired on an inVia-Reflex (Renishaw) at an excitation wavelength of 532 nm and ATR-FTIR (attenuated total-reflection Fourier transform infrared) spectra were obtained on an Excalibur 3100 (Varian). The elemental chemical composition and chemical structure were determined by X-ray photoelectron spectroscopy (XPS, PHI QUANTERA-II equipped with a monochromatic Al Kα source). The analyzer was operated at a pass energy (Ep) of 280 eV for wide scans and 26 eV for fine scans leading to an instrumental resolution of 1.00 eV for wide scans and 0.025 eV for fine scans. The data were collected at a take-off angle of 45° and data analysis and multi-peak fitting were performed by the Multipak software. Time-of-flight secondary ion mass spectrometry (TOF-SIMS) was performed on the TOF-SIMS V (ION TOF GmbH) with 30 keV Bin+ as the primary ion source. The negative spectra were obtained from 500 × 500 μm2 areas by focusing the Bi+ primary ions (less than 0.01 pA of pulsed current) in the “burst alignment” mode at a 10 kHz pulsing rate and 120–130 ns pulse width. The surface potential was measured by a Kelvin probe force microscopy with amplitude modulation (KPFM-AM, Multimode 8, Buker) in the tapping mode on a Multi75E-G (budget sensors) probe in air at room temperature.
4
Comprehensive Perovskite Solar Cell Characterization
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J–V curves of the PSCs were taken using a Keithley 2400 source measure unit under simulated solar illumination of 100 mW cm−2 (AM 1.5G) in the air. The reverse scan is from 1.4–0.2 V and forward scan is from −0.2 to 1.4 V with scan rate of 100 mV/s. The FTIR spectra were recorded on Excalibur 3100 (varian, Palo Alto, CA, USA). X-ray diffraction (XRD) patterns were tested by X-ray diffractometer (Bruker, Karlsruhe, Germany) with Cu ka radiation. The surface and cross section morphological of the perovskite films and PSCs devices were recorded by the scanning electron microscope (SEM S-4800, HITACHI, Tokyo, Japan). Atomic force microscopy (AFM) of perovskite film was tested by the equipment of Bruker Dimension Icon. UV–vis absorption spectra of samples were measured by spectrophotometer (Cary 5000, Palo Alto, CA, USA). Steady-state photo-luminescence (PL) spectra and time resolved photoluminescence (TRPL) decay was measured by PL spectrometer (F900, Xianggan, Beijing, China) with an excitation wavelength of 510 nm and 375 nm respectively. The IPCE measurements were carried out by Zolix SCS10-X150-DZ system (Zolix, Beijing, China) with the DC mode.
5
Characterization of Novel Organic Compounds
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Nuclear magnetic resonance (1H NMR) spectra were recorded on Bruker Avance AV300 (300 MHz) NMR instrument using CDCl3 as the solvent. Absorption and emission spectra were measured on a UV-1601PC Shimadzu spectrophotometer and RF-5301PC Shimadzu spectrofluorophotometer. Bruker ALPHA FT-IR spectrophotometer was used for records Fourier transform infrared (FT-IR) spectroscopy analysis. Thermogravimetric analyses (TGA) were conducted using a SDT 2960 TA instrument. All samples were heated under nitrogen atmosphere from 25 °C to 800 °C using a heating rate of 10 °C/min. FT-IR spectra were recorded in the range of 3800–400 cm−1 using a Varian Excalibur 3100. Samples were mixed with KBr powder and grounded in an agate mortar before being pressed into a disk for recording the spectrum.
6
Comprehensive Characterization of Nanomaterials
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Transmission electron microscopy (TEM) images were obtained on a JEOL-2100 microscope or a JEOL2100F microscope, with both instruments operated at an accelerating voltage of 200 kV. Field emission scanning electron microscopy (FESEM) images were obtained on a Hitachi S-4800 instrument. Fourier-transform infrared (FTIR) spectra were collected on Excalibur 3100 (Varian, USA) spectrophotometer using an attenuated total reflection mode over the range 4000–600 cm−1 at a resolution of 4 cm−1. X-ray photoelectron spectroscopic (XPS) data were obtained on a Quantum 2000 Scanning ESCA Microprobe (Physical Electronics) using monochromatic Al-Kα radiation (hν = 1486.6 eV) as the excitation source. X-ray absorption fine structure (XAFS) data were collected at the Beijing Synchrotron Radiation Facility (BSRF), with the raw fluorescence mode data processed via background-subtraction, normalization and Fourier transformations using the standard procedures within the ATHENA program. Fluorescence spectra were recorded on F-4600 (Hitachi, Japan) luminescence spectrometer.
7
ATR-FTIR Analysis of Pretreatment and Dyeing
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In order to monitor some of the chemical changes occurring during the pretreatment and dyeing processes, Attenuated Total Reflection—Fourier Transform Infrared (ATR-FTIR) spectroscopy was used to analyze the fabric samples at different stages of the pretreatment and dyeing processes with the Victoria Blue R dye. In summary, fabric samples were placed on a potassium bromide (KBr) plate, pressed under the germanium crystal of ATR (UMA 400, Varian Inc., Palo Alto, CA, USA) and scanned in the mid-IR region (500–4000 cm−1 with a 4 cm−1 resolution) with an FTIR spectrometer (Excalibur 3100, Varian Inc., Palo Alto, CA, USA) equipped with an Attenuated Total Reflection (ATR) accessory. The ATR-FTIR spectra were displayed in absorbance units with each spectrum representing an average of 128 scans and taking into account the background spectrum acquired using a blank KBr plate.
8
Characterization of MIL-101(Fe) Adsorbent
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The synthesized
MIL-101(Fe) was characterized by Brunauer–Emmett–Teller
(BET) surface area, scanning electron microscopy (SEM), X-ray power
diffraction (XRD), Fourier transform infrared spectroscopy (FTIR),
and X-ray photoelectron spectroscopy (XPS). For the characterization
of MIL-101(Fe) after adsorption of berberine, the material after the
reaction was washed with water and ethanol two times, respectively.
And then, the product was vacuum-dried at 60 °C for 24 h and
used for characterization.
The specific surface area of MIL-101(Fe)
was calculated by the BET equation from N2 adsorption/desorption
isotherms, which was conducted by Quadrasorb SI-MP. The morphology
of the material before and after the adsorption of berberine was observed
by SEM (Hitachi SU8010, Japan). The synthesized samples were also
characterized by FTIR (Excalibur 3100, Varian) in the range of 400–4000
cm–1 to identify the functional groups on the adsorbent
surface. X-ray diffraction analysis of the samples before and after
reaction with berberine was conducted using X-ray power diffraction
in the range from 3 to 50°. In addition, to determine the surface
chemical composition of the material before and after the adsorption
of berberine, XPS (ESCALAB-MKII, VG Co., Bruker, Germany) analysis
was performed.
MIL-101(Fe) was characterized by Brunauer–Emmett–Teller
(BET) surface area, scanning electron microscopy (SEM), X-ray power
diffraction (XRD), Fourier transform infrared spectroscopy (FTIR),
and X-ray photoelectron spectroscopy (XPS). For the characterization
of MIL-101(Fe) after adsorption of berberine, the material after the
reaction was washed with water and ethanol two times, respectively.
And then, the product was vacuum-dried at 60 °C for 24 h and
used for characterization.
The specific surface area of MIL-101(Fe)
was calculated by the BET equation from N2 adsorption/desorption
isotherms, which was conducted by Quadrasorb SI-MP. The morphology
of the material before and after the adsorption of berberine was observed
by SEM (Hitachi SU8010, Japan). The synthesized samples were also
characterized by FTIR (Excalibur 3100, Varian) in the range of 400–4000
cm–1 to identify the functional groups on the adsorbent
surface. X-ray diffraction analysis of the samples before and after
reaction with berberine was conducted using X-ray power diffraction
in the range from 3 to 50°. In addition, to determine the surface
chemical composition of the material before and after the adsorption
of berberine, XPS (ESCALAB-MKII, VG Co., Bruker, Germany) analysis
was performed.
9
Characterization of Hydrogel Composition
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NMR spectra was performed on a 400 MHz Bruker NMR spectrometer (Avance-400, Varian) at 25 °C with D2O as the solvent. FTIR was obtained on a Varian Excalibur 3100 spectrophotometer. XRD pattern was collected on a Bruker X-ray diffractometer (D8 focus, Cu Kα, λ = 0.15178 nm) with the step of 0.1° s−1. After freeze-dried by vacuum freeze-drying at −80 °C, the morphology of hydrogel was seen by scanning electron microscopy (SEM) (Hitachi-S4800, Japan) at the voltage of 10 kV.
10
Characterization of GNP/PDMS Nanocomposites
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GNP/PDMS
nanocomposites were characterized by X-ray diffraction (XRD) and Fourier
transform infrared (FTIR) spectroscopy. X-ray diffraction was done
in a Panalytical X’Pert PRO diffractometer
with a Cu radiation source operating at 45 kV and 300 mA. The scanning
of 2θ was carried out from 10° to 90° in substeps
of 0.01. FTIR spectra were captured in a Varian Excalibur 3100 apparatus
(California, USA) in the wavenumber range of 4000–500 cm–1 at 2 cm–1 resolution.
The
dispersion of GNPs in the PDMS matrix was analyzed by observing cryogenic
fractures with scanning electron microscopy (SEM). For this purpose,
a Hitachi S-3400N machine was used. The samples were coated by sputtering
a thin layer of gold for proper microstructural observation.
Nonisothermal differential scanning calorimetry (DSC) tests were
carried out with a Mettler-Toledo 882e device from
−145 to 70 °C at 10 °C/min. Glass transition temperature
(Tg) was evaluated to analyze the influence
of the GNP content.
nanocomposites were characterized by X-ray diffraction (XRD) and Fourier
transform infrared (FTIR) spectroscopy. X-ray diffraction was done
in a Panalytical X’Pert PRO diffractometer
with a Cu radiation source operating at 45 kV and 300 mA. The scanning
of 2θ was carried out from 10° to 90° in substeps
of 0.01. FTIR spectra were captured in a Varian Excalibur 3100 apparatus
(California, USA) in the wavenumber range of 4000–500 cm–1 at 2 cm–1 resolution.
The
dispersion of GNPs in the PDMS matrix was analyzed by observing cryogenic
fractures with scanning electron microscopy (SEM). For this purpose,
a Hitachi S-3400N machine was used. The samples were coated by sputtering
a thin layer of gold for proper microstructural observation.
Nonisothermal differential scanning calorimetry (DSC) tests were
carried out with a Mettler-Toledo 882e device from
−145 to 70 °C at 10 °C/min. Glass transition temperature
(Tg) was evaluated to analyze the influence
of the GNP content.
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