Sdt q600 instrument
The SDT Q600 is a simultaneous thermal analysis (STA) instrument that can perform thermogravimetric analysis (TGA) and differential scanning calorimetry (DSC) measurements simultaneously. The instrument is designed to measure changes in a sample's mass and heat flow as a function of temperature and time under controlled atmospheric conditions.
Lab products found in correlation
11 protocols using sdt q600 instrument
Characterization of Freeze-Dried Hydrogel Samples
Thermal Analysis of BNSF Nanofibers
Temperature modulated differential scanning calorimetry (TM-DSC) was conducted with a Q100 calorimeter (TA Instruments, Wilmington, DE, USA) equipped with a refrigerated cooling system. The N2 flow rate was set to 50 mL/min, and measurements started at −30 °C and ended at 400 °C. The temperature increased at a rate of 2 °C/min and was modulated every 60 s at an amplitude of 0.318 °C to measure the reversing heat capacity.
Comprehensive Material Characterization Protocol
Characterization of Inorganic Compounds
Organic Matter Content in Mollusk Shells
Thermal Analysis of Materials
The melting enthalpy obtained with DSC thermograms was determined from the area under the endotherms using TRIOS Software 5.2 TA Universal Data Analysis.
Characterization of Hydrogel Films
The XPS analysis of hydrogels was performed using Mg-Kα as the excitation source at 120 W (Amicus spectrometer, Kratos, Kanagawa, Japan). All peak positions were corrected based on C 1s binding energy (285 eV).
Thermogravimetric and differential scanning calorimetry analyses were performed using the SDT Q-600 instrument (TA Instruments Co., New Castle, Delaware). Hydrogel films of 1.5 ± 0.3 mg were tested at a heating rate of 10 °C.min−1 from RT to 500 °C. The samples were loaded into an open platinum pan, and an empty cup was used as a reference. The thermal analyses were performed under the continuous flow of dry nitrogen gas (30 mL.min−1) (n ≥ 2).
Scanning electron microscopy images were taken from the surface of hydrogels using a FEI–Inspect S50 microscope (FEI Company, Hillsboro, OR, USA). Before analysis, samples were coated with a thin gold film by sputtering, using a low deposition rate to avoid sample damage.
Thermal and Thermogravimetric Analysis
Comprehensive Characterization of SD-SEAL
Melting Point Characterization of DCN
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