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S 4300 microscope

Manufactured by Hitachi
Sourced in Japan

The S-4300 is a scanning electron microscope (SEM) manufactured by Hitachi. It provides high-resolution imaging of samples by scanning the surface with a focused electron beam. The S-4300 is capable of magnifying samples up to 300,000 times and can produce detailed images of the surface topography and composition.

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10 protocols using s 4300 microscope

1

Characterizing ARPE-19 Cell Monolayer Integrity

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ARPE 19 cell monolayers were cultured in a TEER plate (0.4 μm pore size and 12 mm diameter; Corning Transwell, Sigma-Aldrich, St. Louis, MA, USA) and analyzed by (1) scanning electron microscopy using HITACHI S-4300 microscope operated at 5 keV (the detector features 1280 × 960 pixel), (2) the TEER values (Ωcm2) using an electrical resistance system (KANTO CHEMICAL CO. INC., Tokyo, Japan) and (3) FITC-dextran permeability measurements by measuring the fluorescence intensity of the amount of FITC that permeated through the membrane from the basal compartment to the apical compartment during a period of 60 min as described in a previous study [27 (link),28 (link),29 (link)].
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2

Transepithelial Electrical Resistance Measurement of HTM Cells

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HTM cell monolayer TEER was determined according to previously described methods50 (link). Briefly, HTM cells prepared in 150 mm 2D cultured dishes as above were washed with a PBS, and the cells were detached using 0.25% Trypsin/EDTA. After centrifugation for 5 min at 300×g, the cell pellet was re-suspended in grown medium A and HTM cells were seeded on 12 well plates for TEER (0.4 μm pore size and 12 mm diameter; Corning Transwell, Sigma-Aldrich) at a density of 2.0 × 104 cells per well. In each well of the TEER plate, the apical side (inside of the membrane inserts) and basal side (outside of the membrane inserts) were maintained in 0.5 mL and 1.5 mL of growth medium A, respectively. When cells had reached approximately 80% confluence, 5 ng/mL TGFβ2 was added to the grown medium A of the apical side in the absence or presence of 10 µM Rip or 10 μM Y27632 (Day 1). This culture medium of the apical side in each experimental group was changed every other day. At Day 6, TEER (Ωcm2) was measured using an electrical resistance system (KANTO CHEMICAL CO. INC., Tokyo, Japan) according to the manufacturer’s instructions after washing twice with PBS. Alternatively, after washing with PBS as above, HTM cells on the membrane were processed by scanning electron microscopy (EM) using HITACHI S-4300 microscope operated at 5 keV (the detector features 1280 × 960 pixel).
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3

Quantitative PCR and Scanning Electron Microscopy

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Quantitative PCR using specific primers (Table S1) and statistical analyses using the Graph Pad Prism 8 (GraphPad Software, San Diego, CA, USA) were performed as described in a previous report [37 (link)]. Scanning electron microscopy (SEM) using a HITACHI S-4300 microscope was operated at 5 keV (the detector features 1280 × 960 pixel) as basically reported in our previous study [37 (link)]. For estimation of the statistical difference between study groups, the Student’s t-test for two group comparison or one-way ANOVA followed by a Tukey’s multiple comparison test were used.
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4

Scanning Electron Microscopy of HTM Cells

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2D HTM cells on the membrane for TEER or 3D HTM spheroids were prepared as above and fixed with 2.5% glutaraldehyde overnight, washed with PBS and processed for scanning electron microscopy (EM) using a HITACHI S-4300 microscope operated at 5 keV (the detector features 1280 × 960 pixel) according manufacturers’ operating protocol.
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5

Particle Size Analysis by SEM

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Scanning electron microscopy (SEM) was completed using a Hitachi S4300 microscope in order to observe the particle size. Double-sided adhesive carbon tabs were adhered onto aluminum studs (Ted Pella) and carefully dabbed against a weigh paper containing the dry sample. For all systems, three independent samples were prepared and multiple images were examined for each sample.
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6

Cryo-SEM Analysis of Emulsion Morphology

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Cryo-SEM was utilized to study the morphology of the emulsion samples with and without MDA. A small amount of an emulsion sample was placed onto a sample holder and immediately immersed into a liquid nitrogen bath (<−140 °C) for 2 min. The sample was then transferred to the high-vacuum chamber, freeze-fractured, and spray-coated with platinum. Finally, the freeze-fractured surface was observed by a Hitachi S-4300 microscope (Japan) at −135 °C.
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7

SEM Characterization of HNP Particles

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Scanning electron microscopy (SEM) was performed with a Hitachi S4300 microscope (Tokyo, Japan). Three milliliters of HNP solutions were transferred to a weigh boat and allowed to evaporate under mild heating on a hot plate. Double-sided adhesive carbon tabs were adhered to aluminum studs (Ted Pella, Redding, CA) and blotted on dried HNPs. Samples were coated with a thin film of a gold/palladium alloy using an Emscope SC400 sputter coating system at 20 mA for 1 minute under argon gas. For all electron microscopy experiments at least 3 independent samples were examined and multiple images were examined for each sample. ImageJ® software (NIH, Bethesda, MD) was used to measure particle diameter in multiple (n>3) representative images.
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8

Comprehensive Characterization of Rhenium-Doped Quantum Dots

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UV-vis absorption spectrum was recorded on a Shimadzu UV 2450PC spectrophotometer (Shimadzu Corp.). PL spectrum was monitored on a Perkin Elmer LS 55 luminescence spectrometer (PerkinElmer Inc.). Upconversion fluorescence spectrum was recorded by a Tsunami® femtosecond Ti:sapphire oscillator (Spectra-Physics, Santa Clara, CA, USA). HRTEM images were observed with a FEI Tecnai G2F30 microscope (FEI). The as-prepared RQDs were appropriately diluted with Milli-Q water before instrumental analysis. Scanning electron microscopy (SEM) images were taken by a Hitachi S-4300 microscope (Hitachi Ltd., Tokyo, Japan). To prepare the samples for SEM imaging, dried precipitates obtained by adding formic acid into the solution of synthesized RQDs were firstly scattered onto carbon conductor tape followed by coating with gold.
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9

Characterization of Iron Oxide Nanoparticles in MnMs

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Scanning transmission electron microscopy (STEM) was carried out in order to confirm the presence of iron oxide in the MnMs and to observe the spatial distribution of the nanoparticles within the composites. Powders were dispersed in chloroform at 100 µg/ml, added dropwise onto a support film grid (Electron Microscopy Sciences, Hatfield, PA), and allowed to dry overnight in a desiccator over Drierite™. Chloroform was used as a dispersant because D-Mannitol is practically insoluble in this organic solvent [39 (link)]. Images were captured with a JEOL 2100F Field Emission Electron Microscope (JOEL, Tokyo, Japan) equipped with an Oxford EDS detector (Oxford Instruments, Oxford, United Kingdom).
Scanning electron microscopy (SEM) was performed in order to observe the particle size, surface roughness, shape and morphology. A Hitachi S4300 microscope (Tokyo, Japan) was used to capture images. Double-sided adhesive carbon tabs were adhered to aluminum studs (Ted Pella, Redding, CA) and blotted on weigh paper with our dry powder. These samples were coated with a thin film of a gold/palladium alloy using an Emscope SC400 sputter coating system at 20 mA for 2 minutes under argon gas. For all electron microscopy experiments at least 3 independent samples were examined and multiple images were examined for each sample.
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10

Scanning Electron Microscopy of Nanoparticles

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The shape and surface morphology of the NP and nCmP were evaluated by SEM using a Hitachi S-4300 microscope (Tokyo, Japan). nCmP samples were placed on aluminum SEM stubs (TedPella, Inc., Redding, CA, USA) with double-sided adhesive carbon tabs. Nanoparticles were dispersed in basic water (pH = 9, 10 mg/mL) and this suspension was dropped onto aluminum SEM stubs and then dried at room temperature. Both the NP and nCmP samples were coated with a thin film of a gold/palladium alloy using an Emscope SC400 sputter coating system at 20 µA for 75 seconds under argon gas. Images were captured at 5 kV.
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