S 4300 microscope
The S-4300 is a scanning electron microscope (SEM) manufactured by Hitachi. It provides high-resolution imaging of samples by scanning the surface with a focused electron beam. The S-4300 is capable of magnifying samples up to 300,000 times and can produce detailed images of the surface topography and composition.
Lab products found in correlation
10 protocols using s 4300 microscope
Characterizing ARPE-19 Cell Monolayer Integrity
Transepithelial Electrical Resistance Measurement of HTM Cells
Quantitative PCR and Scanning Electron Microscopy
Scanning Electron Microscopy of HTM Cells
Particle Size Analysis by SEM
Cryo-SEM Analysis of Emulsion Morphology
SEM Characterization of HNP Particles
Comprehensive Characterization of Rhenium-Doped Quantum Dots
Characterization of Iron Oxide Nanoparticles in MnMs
Scanning Electron Microscopy of Nanoparticles
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