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Tecnai g2 f30 super twin

Manufactured by Thermo Fisher Scientific
Sourced in United States

The Tecnai G2 F30 Super Twin is a high-performance transmission electron microscope (TEM) designed for advanced materials research and analysis. It features a field emission gun (FEG) electron source, providing high-brightness and high-resolution imaging capabilities. The microscope is equipped with a super-twin lens system, enabling improved resolution and image quality. It is capable of operating at an accelerating voltage of up to 300 kV.

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6 protocols using tecnai g2 f30 super twin

1

Octominin-CNPs Morphological Characterization

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Morphological characterization of the Octominin-CNPs or CNPs was performed by TEM analysis. Briefly, samples were dissolved in PBS and 10 µL of the sample was placed on formvar/carbon-coated copper grid and incubated for 10 min. The excess sample amount was removed using filter paper. Then, 5 µL of 2% uranyl acetate (Sigma-Aldrich, St. Louis, MO, USA) was placed on the grid for 5 s, and the excess amount of uranyl acetate was removed by aspiration using filter paper. The dried grid was observed using a 300 keV Field emission–TEM (TecnaiTM G2 F30 super-twin (FEI), Hillsboro, OR, USA).
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2

Characterizing Organic Solar Cell Performance

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The current–voltage (I–V) characteristics were recorded using an Iviumsoft apparatus with simulated AM 1.5 illumination (100 mW cm−2) via a solar simulator (Abet Technologies Sun 3000) in normal air conditions. The thicknesses of the coated films were measured using a thickness profile metre (Surfcorder ET 3000, Kosaka Laboratory, Ltd.). Cross-sectional TEM samples of the printed OSC module were prepared using a dual beam-focused ion beam (Helios NanoLabTM). The TEM images were obtained using field emission TEM (FEI TecnaiTM G2 F30 Super-Twin) operated at 200 kV. The topographies of surface images were characterized using atomic force spectroscopy.
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3

Imaging HNRNPG Protein Domains

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The purified GST-fusion C-RBD or N-RRM domain of the HNRNPG protein was diluted to 5 μM in 10 mM Tris-Cl (pH 7.4), 100 mM KCl, 2.5 mM MgCl2. The 5 μl sample solution was spotted on a 400 mesh carbon grid, washed with 1–2 drops of water, stained with 2 drops of 1% uranyl acetate, blotted and dried in air. Images were obtained at 68.6K× magnification on an FEI Tecnai G2 F30 Super Twin scanning transmission electron microscope.
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4

Characterization of Nanowire Devices

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The nanowires dispersed in hexane were spread on a copper grid and a silicon wafer for measurement using transmission electron microscopy (TEM) and scanning electron microscopy (SEM), respectively. TEM image and STEM-EDX were taken with a FEI Tecnai G2 F30 Super-Twin transmission electron microscope operating at 300 kV. SEM image and X-ray mapping data were obtained with a JSM-6700F field emission scanning electron microscope at 30 kV operating voltage, equipped with an INCA energy dispersive X-ray spectrometer (EDS). X-ray diffraction (XRD) patterns were taken using a Rigaku Ultima III diffractometer equipped with a rotating anode and Cu Kα radiation source (λ = 0.15418 nm). Electrical characterization of the nanowire devices was performed using a probe station (MSTECH MST-6000C, Korea) and the Keithley SCS-4200 system.
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5

Transmission Electron Microscopy of e-SiNWs and Spheroids

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As we have described previously (67 ), e-SiNWs were gently sonicated in isopropyl alcohol and dispersed onto lacey carbon grids (Ted Pella Inc.). Transmission electron microscopy imaging was conducted using a 300-kV FEI Tecnai G2 F30 Super Twin transmission electron microscope. Spheroids were fixed with 2.5% glutaraldehyde, postfixed in PBS-buffered 1% osmium tetroxide with 1.5% K+ ferricyanide, dehydrated in graded ethanol and acetonitrile, and embedded in PolyBed 812 (Polysciences). Seventy-nanometer-thick spheroid sections were prepared using a Leica UltraCut R and a diamond knife, stained with Hanaichi Pb citrate and uranyl acetate, and imagined using a JOEL 200 CX transmission electron microscope.
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6

Comprehensive Characterization of Catalysts

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The X-ray powder diffraction (XRD) patterns were recorded on a Rigaku D/Max 2500 VB2 + /PC X-ray powder diffractometer equipped with Cu Kα radiation (λ = 0.154 nm). Transmission electron microscopy (TEM) images were obtained with a JEOL JEM-1230 transmission electron microscope operating at 100 kV. High-resolution TEM (HRTEM) and energy-dispersive X-ray spectrometry (EDX) elemental mapping were performed using an FEI Tecnai G2 F30 Super-Twin high-resolution transmission electron microscope at an accelerating voltage of 300 kV. The X-ray photoelectron spectra (XPS) were measured using a Thermo Fisher ESCALAB 250Xi XPS system with a monochromatic Al Kα X-ray source. All binding energies were calibrated to the C 1 s peak (284.8 eV). Inductively coupled plasma optical emission spectroscopy (ICP-OES, Optima 7300 DV, Perkin Elmer) was used to determine the metal contents of as-prepared catalysts.
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