analysis were characterized for the prepared sample by a scanning
electron microscope (SEM, Hitachi SU8230) equipped with energy-dispersive
X-ray analysis (EDX). The X-ray diffraction (XRD, Bruker D8) has been
performed to confirm the formation of the prepared phase and determine
its crystallinity. X-ray photoelectron spectroscopy (XPS, SPECS EnviroESCA)
has been employed to estimate the surface composition and electronic
state of the elements in the prepared sample. Atomic absorption spectroscopy
(AAS, Agilent FS 240) was used to further confirm the Al etching rates,
and the specific surface area of samples was measured by a surface
area and porosity analyzer (Micromeritics TriStar 3000). Surface termination
groups have been verified by a Fourier transform infrared spectrometer
(FTIR, Thermo Scientific Nicolet iS10). The electrochemical characterization
and data analysis were performed using electrochemical workstations
(Solartron SI 1280 and SI 1260) equipped with software Corrware and
Zplot (Scribner Associates Inc.).