The SEM images were taken with Hitachi- S4160 scanning microscope (Tokyo, Japan) to survey the morphological pattern and surface structural aspects of GO and Fe3O4@SiO2-GO nanocomposite. A Nanoscope V multimode atomic force microscope (Veeco Instruments, USA) were used to perform AFM measurements. The AFM images were taken from samples which prepared by deposition a dispersed GO/methanol solution (70 mg mL−1) onto a mica surface and allowing them to dry in air [25 (link)]. The images were taken under ambient condition by adjusting the instrument on the tapping mode.
S4160 scanning microscope
Manufactured by Hitachi
Sourced in Japan
The S4160 is a scanning microscope manufactured by Hitachi. It is designed to provide high-resolution imaging of samples through the use of an electron beam. The core function of the S4160 is to enable the observation and analysis of the surface and internal structure of a wide range of materials at the microscopic level.
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Lab products found in correlation
2 protocols using s4160 scanning microscope
1
Characterization of GO and Fe3O4@SiO2-GO Nanocomposite
2
Microscopic Characterization of Graphene Oxide
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A Hitachi-S4160 scanning microscope were used to provide SEM images (Tokyo, Japan). The AFM measurements were obtained by using a Nanoscope V multimode atomic force microscope (Veeco Instruments, USA). Samples prepared for the AFM measurements contained dispersions of GO/methanol solutions (70 mg mL−1) smeared on a fresh mica surface and allowed drying in the air.33 (link)
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