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194 protocols using tm3030

1

Characterization of Nano-TiO2 Coated Cotton Yarns

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A SEM with an attached EDX (Hitachi TM3030, Hitachi High-Technologies Corporation, Japan) was used to characterize the morphological structures and elemental information of the nano-TiO2 coated yarn for each washing cycle. Before the analysis, the coated cotton yarn was sputtered with a thin layer of gold to avoid electrostatic charging during testing and to capture a good image of the nano-TiO2 coated cotton yarn. The samples were tested using two different magnifications, which were 500× and 5000× magnification, respectively. Meanwhile, the morphological structures and band gap of nano-titania were characterized using SEM (Hitachi TM3030, Hitachi High-Technologies Corporation, Tokyo, Japan) and a UV-Vis spectroscopy (Model Cary 5000, Agilent, CA, USA), respectively.
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2

Durability Analysis of Microcapsule-Finished Fabrics

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The finished fabric was sputtered gold and observed under a desktop electron microscope (TM3030, Hitachi, Tokyo, Japan) at a voltage of 3 kV. Elemental analysis was performed by energy scattering spectroscopy (EDX, TM3030, Hitachi, Tokyo, Japan). Reference standards GB/T 12490-2014 and GB/T 3920-2008, the fabrics finished with microcapsules, were tested for washing resistance and friction resistance, respectively. For the washing resistance test, the fabric (100 mm × 40 mm) was washed for 0, 5, 10, 20 and 30 cycles and naturally dried indoors. One washing cycle lasted for 30 min, clean water was used and the water level was moderate; the temperature of the washing water was 30–40 °C. The wash resistance of the fabric was characterized by calculating the content and loss of essential oil on the fabric after washing. For the friction resistance test, the fabric (50 mm × 200 mm) was rubbed against the friction head with a lining cloth (50 mm × 50 mm) for 0, 10, 20, 30, 50 and 100 times under vertical pressure (9 ± 0.2 N), and the friction resistance of the fabric was characterized by calculating the content of essential oil on the fabric after friction.
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3

Comprehensive Catalyst Characterization

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The as-synthesized samples were identified by X-ray powder diffraction (XRD) with Cu-Kα radiation (Ultima IV, Rigaku, Japan). The synchrotron XRD (SXRD) patterns were collected using a Debye–Scherrer camera installed at the BL02B2 beamline in SPring-8, Japan. The wavelength was determined as 0.49968 Å using CeO2 as a reference. The SXRD data were analyzed using the Rietveld refinement program RIETAN-FP.20 Specific surface areas were determined by Brunauer–Emmett–Teller (BET) analysis of Kr gas adsorption data (BELSORP-max, MicrotracBEL, Japan). The morphologies of all the catalysts were confirmed by scanning electron microscopy (SEM) images (TM3030, Hitachi High-Tech, Japan). X-ray absorption near edge structure (XANES) spectra of Cr, Mn, and Fe K-edges were collected in the transmission mode at the BL14B2 beamline in SPring-8. The X-ray absorption spectra were normalized by spline functions between pre-edge and post-edge regions using Athena program of the IFEFFIT package.21 (link)
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4

Characterization of Nanomaterial Synthesis

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The morphology of the synthesized materials was examined by using scanning electron microscopy (SEM) (TM3030 (Hitachi High-Technologies, S-4700 Type II, Tokyo, Japan)) followed with energy-dispersive X-ray spectroscopy (EDS). EDS mapped the present elements on the nanomaterial surface at 15 kV acceleration (Brucker Quantax 70 X-ray detector system, Brucker Nano, Berlin, Germany, GmbH Germany, Berlin, Germany). XRD analysis was performed with Rigaku MiniFlex II desktop X-ray diffractometer with Cu Ka radiation, in the 2θ° angle range 0–90°. Particle size was obtained by dynamic light scattering (DLS) on Dynamic Anton Paar Litesizer™500. Parameters that were followed to analyze the particle size of the nZVI-BC and FStreated were particle size distribution by intensity, volume, and number.
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5

Scanning Electron Microscopy of Implant Abutments

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The surface morphology of the abutments will be evaluated using an analytical benchtop scanning electron microscope (TM3030, Hitachi High-Technologies Europe GmbH, Krefeld, Germany). The samples will be mounted on aluminium stubs with conductive carbon tape and images will be taken with an accelerating voltage of 15 kV. Prior to imaging, the polymeric samples, such as PEEK and PMMA, will be sputter-coated with gold (Cressington 108 Auto, Cressington Scientific Instruments, Watford, UK). The images obtained will serve to describe materials’ external morphology (texture) as well as the cleanness of a surface.
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6

Scanning Electron Microscopy Analysis of Coins

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A total of 48 coins (n = 6 from each group), and debris from each bur-sequence procedure were analysed with a scanning electron microscope TM3030 (Hitachi High-Technologies Europe GmbH, Krefeld, Germany). The samples were mounted on an aluminum holder with carbon tape and copper conductive tape. Scanning electron microscope (SEM) images were obtained with backscattered electrons at 15 kV voltage. Furthermore, energy dispersive x-ray spectroscopy (EDX)(Quantax 70, Bruker, Billerica, USA) was used for detection of chemical elements measured in atomic percentage on the titanium coin surfaces [25 (link)].
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7

Freeze-Dried LEW Gel Microstructure Imaging

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The freeze-dried LEW gel samples were cut into a 1 cm × 1 cm × 1 cm cube and placed on the plate. Samples were then sputter-coated with gold powder in vacuum, and the surface micromorphologies of gels were observed by a scanning electron microscope (SEM) (TM3030, Hitachi high-technologies Corporation, Tokyo, Japan) under an electron accelerating voltage of 15 kV. The imaged photos were produced at 100× magnification.
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8

Comprehensive Nanoparticle Characterization

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Elementary analysis was performed as described previously [6] . Elements of the freeze-dried nanoparticle were detected by Electron Probe Microanalyzer, EPMA (JEOL, Tokyo, Japan). Scanning electron microscope (SEM) observations were performed on the nanoparticles (Hitachi High-Technologies, TM3030, Tokyo, Japan). Raman spectroscopy was performed against the powder segment of the freeze-dried nanoparticles following the conditions of inVia Reflex Raman microscopy (Renishaw K.K, Tokyo, Japan), as follows: Laser: LD pumped green laser (532 nm), objective lens magnification×50, irradiating laser beam diameter about 1.5 µm, irradiation laser power 1 mW or less, photometric Raman shift range 4000–150 cm−1, wave number resolution about 6 cm−1, number of integrations 10, data processing library search by spectral waveform comparison with database (Raman Library “RAMANDB,” JEOL, Tokyo, Japan).
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9

Microscopic Characterization of Printed Tablets

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SEM pictures were captured (SEM microscope model TM3030; Hitachi High-Tech Corp., Japan) under vacuum at 15 kV to obtain information about printed tablet and talc powder morphology on a microscopic level.
Particle size distribution of talc was determined by powder dispersion in deionized water, followed by dynamic light scattering measurements, which were analysed with inbuilt software (ver. 3.62) (Mastersizer 3000; Malvern Instruments, UK). Analysis was performed in triplicate.
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10

Nanofibrous Scaffold Characterization

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The morphology of the nanofibers was examined using scanning electron microscopy (SEM, TM3030, Hitachi High-Technologies Europe GmbH, Krefeld, Germany). Nanofibers were carefully peeled from the collector, cut into pieces, then mounted on aluminum stubs using double-sided carbon conductive tape, and sputter-coated with gold in 15 s before observing. SEM was conducted on the top surface of the fiber mat, defined as the surface exposed to the air during spinning and used for subsequent cell culture. All images were taken in backscattered electron mode at an accelerating voltage of 15 kV. Using ImageJ software (NIH, USA), fiber diameters were assessed based on 50 fibers per sample type, expressed as mean and standard deviation (SD). The void size between fibers was analyzed in segmented images from original SEM images using ImageJ. The porosity percentage was calculated based on the apparent density of nanofiber mat in comparison with the film [45] .
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