Fourier transform
infrared spectroscopy (FTIR-6600 type A) was used to examine the bonding
and functional groups of the samples in the range of 4000–400
cm–1. An X-ray diffractometer (Shimadzu XRD-7000)
with Cu Kα radiation (λ = 1.5406 Å), operating in
the range of 2θ = 20–80°, was used to determine
the crystallinity and phases of the samples. The morphologies of the
samples were examined by field-emission scanning electron microscopy
(FE-SEM, JSM 6500F, JEOL) and transmission electron microscopy (TEM)
(FEG TEM Tecnai G2 F30). X-ray photoelectron spectroscopy (XPS) (ESCALAB
250) was used to examine the chemical states of the sample. A Shimadzu-3600
plus UV–vis spectrophotometer was used to analyze the concentration
of the MB dye at a maximum wavelength of 664 nm. A Shimadzu-3600 plus
UV–vis spectrophotometer was used to measure UV–vis
diffuse reflectance spectra (DRS) by using BaSO4 as a reference.
infrared spectroscopy (FTIR-6600 type A) was used to examine the bonding
and functional groups of the samples in the range of 4000–400
cm–1. An X-ray diffractometer (Shimadzu XRD-7000)
with Cu Kα radiation (λ = 1.5406 Å), operating in
the range of 2θ = 20–80°, was used to determine
the crystallinity and phases of the samples. The morphologies of the
samples were examined by field-emission scanning electron microscopy
(FE-SEM, JSM 6500F, JEOL) and transmission electron microscopy (TEM)
(FEG TEM Tecnai G2 F30). X-ray photoelectron spectroscopy (XPS) (ESCALAB
250) was used to examine the chemical states of the sample. A Shimadzu-3600
plus UV–vis spectrophotometer was used to analyze the concentration
of the MB dye at a maximum wavelength of 664 nm. A Shimadzu-3600 plus
UV–vis spectrophotometer was used to measure UV–vis
diffuse reflectance spectra (DRS) by using BaSO4 as a reference.