D max rb x ray diffractometer
The D/max-RB X-ray diffractometer is a laboratory instrument designed for X-ray diffraction analysis. It provides a reliable and precise method for the identification and characterization of crystalline materials. The core function of this equipment is to generate and detect X-rays that interact with the sample, producing a diffraction pattern that can be analyzed to determine the material's structure and composition.
Lab products found in correlation
15 protocols using d max rb x ray diffractometer
Synthesis and Characterization of 3D Porous Si-CaP
Characterizing Treated and Untreated Cellulose Substrates
infrared (FT-IR)
spectra of CTS, CL-CTS, and PACTS at wavenumbers between 400–4000
cm–1 were measured using WQF-520 FT-IR spectrometer
(Beijing Beifen-ruili Analytical Instrument (Group) Co., Ltd., China).
Scanning electron microscopy (SEM) of CTS and PACTS was performed
using TSM-7900F (JEOL Ltd., Japan). X-ray diffraction (XRD) analysis
was performed using D/max-RB X-ray diffractometer (Rigaku, Japan)
operating at a voltage of 40 kV and current of 100 mA using Co Kα
radiation. The pH was measured using PHS-25 acidimeter (Shanghai Lei-ci
Instrument, China). The chemical oxygen demand (CODCr)
was measured using a COD rapid detector (DR1010 rapid detector and
DRB200 digestive machine, Hach, USA). Turbidity was determined using
a turbidimeter (2100Q Turbidimeter, Hach, USA). The conductivity was
measured at pre- and post-treatment stages using a conductivity detector
(Sension7, Hach, USA).
Comprehensive Material Characterization Protocol
Characterization of Barium Manganite Nanoparticles
Crystalline State Evaluation by XRPD
Characterization of Composite Wound Dressings
Quantitative X-ray Diffraction Analysis
Characterization of Coagulant Powder
Characterization of Vanadium-Containing Materials
X-ray diffraction (XRD) patterns were performed using a Rigaku D/MAX-RB X-ray diffractometer (Rigaku, Akishima, Japan) with Cu Kα radiation to analyze the phase compositions in the products.
Microscopic observation and elemental analysis were performed using scanning electron microscopy (JSM-IT300, Jeol, Tokyo, Japan) equipped with X-ACT energy dispersive X-ray attachment (Oxford Instruments, Oxford, UK).
Thermogravimetric analysis (TG) experiments were performed using an STA449C analyzer (Netzsch, Germany), heated from room temperature to 1400 °C at a heating rate of 10 °C min−1, and a N2 flow rate of 50 mL min−1.
Characterization of GO, RGO-Zr, and Zr(OC3H7)4 Materials
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