The Fourier transform infrared spectra (FTIR/ATR) of the electrospun samples were measured with an FTIR Nicolet™ iS™ 5 (ThermoScientific®, USA) Each spectrum was obtained in transmittance mode by the accumulation of 32 scans and a spectral range of 4000–600 cm−1. Samples were also observed via scanning electron microscopy with a JCM-6000Plus® Versatile Benchtop SEM (JEOL, USA). Samples were prepared by coating them with a gold/palladium alloy. The resulting images were analyzed with the ruler tool of ImageJ® software to determine the average diameter of the fibers. The maximum swelling ratios (ES, %) of the UV crosslinked samples were measured in distilled water at room temperature and 37 °C, respectively. Dry square samples measuring 5 cm × 5 cm and initial weight (W1) were immersed in a vial with 15 mL of distilled water for 12 h. Afterward, the samples were removed from the vial, excess surface water was wiped away with a paper towel, and the gained weight (W2) was recorded. The swelling ratio (ES) is calculated using the following equation:
Jcm 6000plus versatile benchtop sem
Manufactured by JEOL
Sourced in United States, Japan
The JCM-6000Plus® Versatile Benchtop SEM is a scanning electron microscope designed for a range of applications. It provides high-quality imaging and analysis capabilities in a compact, benchtop format.
Automatically generated - may contain errors
2 protocols using jcm 6000plus versatile benchtop sem
1
Swelling Behavior of UV-Crosslinked Electrospun Fibers
2
Characterization of Co-Fe Coatings
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Elemental analysis of the electrodeposited Co–Fe coatings was performed using the WD X-ray fluorescence (XRF) method (RigakuPrimini). The microstructures and the distributions of the nanocones were observed using the SEM technique (Jeol JCM-6000 Plus Versatile Benchtop SEM, Tokyo, Japan) and energy-dispersive X-ray spectroscopy (EDS) (Tokyo, Japan) analysis. The SEM images showed in Figure 1 were taken through a Hitachi SU-70 scanning electron microscope (Tokyo, Japan). The surface of the Cu conical nanostructures was analyzed using the atomic force microscope (AFM) Ntegra Aura microscope (NT MDT, Moscow, Russia) with an NSG03 tip.
Transmission electron microscopy (TEM) investigations were carried out using an FEI Tecnai TF20 X-TWIN (FEG) microscope (Tokyo, Japan) equipped with an energy-dispersive X-ray spectrometer (EDAX), working at an accelerating voltage of 200 kV.
Thin foils for the TEM investigations were prepared via the focused ion beam (FIB) technique with an FEI Quanta 3D 200i FIB/SEM dual-beam microscope (Tokyo, Japan) equipped with an OmniProbe micromanipulator. An ion beam accelerating voltage of 30 kV and ion currents in the range of 32–0.05 nA were applied.
Transmission electron microscopy (TEM) investigations were carried out using an FEI Tecnai TF20 X-TWIN (FEG) microscope (Tokyo, Japan) equipped with an energy-dispersive X-ray spectrometer (EDAX), working at an accelerating voltage of 200 kV.
Thin foils for the TEM investigations were prepared via the focused ion beam (FIB) technique with an FEI Quanta 3D 200i FIB/SEM dual-beam microscope (Tokyo, Japan) equipped with an OmniProbe micromanipulator. An ion beam accelerating voltage of 30 kV and ion currents in the range of 32–0.05 nA were applied.
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