Model su8220

The X-ray diffraction (XRD) patterns were acquired from an advanced X-ray diffractometer with Cu K_α radiation (Bruker D8). A field-emission scanning electron microscopy (SEM) system (Hitachi, Model SU8220) was used to investigate the morphology of the products. To further determine their microstructures, transmission electron microscopy (TEM) characterization (FEI, Model Talos F200S) operating at 200 kV was carried out. The X-ray photoelectron spectroscopy (XPS) was measured on ESCALAB 250Xi (Thermo Fisher).

Field emission scanning electron microscope (FE-SEM, Hitachi, Model SU 8220, Tokyo, Japan) and high-resolution transmission electron microscope (HR-TEM, Tecnai G2-F20, FEI Company, Hillsboro, OR, USA) equipped with EDS PV9761 detector at the acceleration voltage of 200 kV were used to investigate the morphology and structural properties of the deposited nanocomposite films. The NPs in the films were analyzed by X-ray photoelectron spectroscopy (XPS) measurements with a PHI 5800 ESCA System (Physical Electronics) equipped with a hemispherical energy analyzer and the monochromatized AlKα X-ray source of 250 W. A potentiostat instrument (PARSTAT 2263, Princeton Applied Research, Oak Ridge, TN, USA) was used for the electrochemical measurements. The FTO glass electrode, platinum mesh, and Ag/AgCl were used as a working electrode, counter electrode, and reference electrode, respectively.