Tecnai g2 20 x twin electron microscope
The Tecnai G2 20 X-TWIN is a transmission electron microscope (TEM) designed for high-resolution imaging and analysis of a wide range of materials. It features a 200 kV accelerating voltage and a state-of-the-art twin-lens system for improved image quality and resolution.
Lab products found in correlation
3 protocols using tecnai g2 20 x twin electron microscope
Nanocarrier Morphology Characterization by TEM
Nanomaterial Characterization by Microscopy
Silica Thin Film Electrodeposition and Analysis
The working electrode was a conductive substrate (fluoride-doped tin oxide (FTO)-covered glass) in the case of electrodeposition of silica thin films (see next section) and the same substrate with deposited thin films containing the anchored silver ions for DPASV measurements. As the counter electrode, we used a platinum plate, while the reference electrode was standard Ag/AgCl. DPASV measurements were carried out in 0.1 M NaNO electrolyte solution. For synthesis and electrochemical experiments, we used custom fabricated Teflon cell, allowing for the application of the substrate at the bottom.
The TEM imaging was carried out using the FEI Tecnai G2 20 X-TWIN electron microscope, equipped with emission source LaB6 and CCD camera FEI Eagle 2K. The TEM images were processed (Fourier frequency transformation) using the Gwyddion software [47 (link)].
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