The reinforced CS/BNC and the pristine BNC were freeze-dried in swollen state and were sprayed with gold for observation. The microstructure of the samples was observed with a field emission scanning electron microscope (FE-SEM, S-4800 model, Hitachi, Japan).
S4800 model
Manufactured by Hitachi
Sourced in Japan
The S4800 is a scanning electron microscope (SEM) model manufactured by Hitachi. It is designed to provide high-resolution imaging and analysis of micro- and nano-scale samples. The S4800 utilizes a field emission gun as the electron source, enabling it to achieve a high resolution of up to 1.0 nm at 15 kV. The instrument offers a wide range of magnification capabilities, from 30x to 800,000x, making it suitable for a variety of applications in materials science, biology, and other research fields.
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Lab products found in correlation
4 protocols using s4800 model
1
Microstructural Analysis of Freeze-Dried BNC
2
Protein Morphology by SEM
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Secondary electron microscopy was used to study the morphology of the films of protein transferred to solid surfaces. The protein solution was allowed to reach the equilibrium surface tension. The films were then transferred onto cleaned solid substrates using the Langmuir–Schaefer film transfer technique and characterized using scanning electron microscopy (SEM). A thin layer of gold (200 Å) was sputtered on these samples, and SEM studies were undertaken using a Hitachi S4800 model.
3
Comprehensive Material Characterization Protocol
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Powder X-ray diffraction (XRD) spectra were measured using Bruker D8 Advance, Germany. Strength tests were measured on a DR-507 universal testing machine using sheet parameters with sample strip parameters of 2 mm × 3 mm × 22 mm. A Nicolet iS50 Fourier Transform Infrared (FT-IR) spectrometer from Thermo-Fisher, Horsham, UK, was used. Nitrogen adsorption and desorption tests were performed using a Mack ASAP 2460 model. The surface morphology and particle size of the samples were observed by scanning electron microscopy (SEM) using a Hitachi S4800 model (HITACHI, Tokyo, Japan). We performed comprehensive thermal (TG-DSC) analysis with a simultaneous thermal analyzer model STA449 F5 from NETZSCH Manufacturing GmbH, Frankfurt, Germany, with a heating rate of 10 • C/min in the range of 50 • C-800 • C. The main instruments used in the experiment were a planetary ball mill (Qidong Honghong Instrument Equipment Factory, Qidong, China, KE-0.4L), precision diamond wire cutting machine (Shenyang Kejing Automation Equipment Co., Ltd., SXT-202AQ, Shenyang, China), density meter (Dongguan Dongri Instrument Co., Ltd., DR-200A, Dongguan, China), and an ultraviolet spectrophotometer (Shanghai Jinghua Technology Instrument Co., Ltd., 754PC, Shanghai, China).
4
Scanning Electron Microscopy of Bezafibrate Particles
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Morphological aspects of particles such as shape, surface and size were studied using a scanning electron microscope (S 4800 model, Hitachi, Japan). The particles of bezafibrate plain powder and selected bezafibrate-loaded ternary solid dispersion were secured to the metallic stub using a double-side adhesive tape. Before inspecting through SEM, sputter coating (Model K-575-K, EMI-Teck Ion-Sputter Coater) of the samples was done in the presence of 8×10−3 mbar vacuum pressure, 20 mA current and turbo speed of 90%. The coating was performed with platinum in order to make the samples conductive for image production.
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