Jem 2100plus electron microscopy
The JEM-2100PLUS is a high-performance transmission electron microscope (TEM) manufactured by JEOL. It is designed to provide high-resolution imaging and analytical capabilities for a wide range of materials. The JEM-2100PLUS features a 200 kV electron beam, advanced electron optics, and a stable mechanical and electrical system to enable high-quality imaging and analysis.
2 protocols using jem 2100plus electron microscopy
Nanomorphology and Electrochemical Characterization
Characterization of SARS-CoV-2 Detecting Nanoparticles
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