X maxn 150 mm2 silicon drift detector

A high resolution field emission scanning electron microscopy (Zeiss Sigma FE-SEM) was used to observe the presence of the gold nanoparticles on the surface of chips A1, B1, C1 and D1. Images were obtained at magnifications ranging from 10,000x to 200,000x using an acceleration voltage of 15 KV, and using a secondary electron (SE) in-lens and backscattered electron (BSE) detector. An energy-dispersive X-ray detection instrument (EDX) was used to identify the elemental composition of surfaces of chips A1, B1, C1 and D1. An Oxford Instruments X-Max^N 150 mm² Silicon Drift Detector (SDD) detector was used for such point analysis and mapping of elemental spatial distributions.

ASD was purchased from Power Technology Inc. (Arden Hills, MN, USA) and was made of 50% JIS Z8901 Class 8 (SiO₂, Al₂O₃, MgO, Fe₂O₃, TiO₂, CaO) and 50% natural SiO₂. ASD’s morphology and size were determined using scanning electron microscopy (SEM) on Zeiss Gemini500 scanning electron microscope (Carl Zeiss Meditec AG, Jena, Germany) and transmission electron microscope (TEM) on a JEM-2100F electron microscope (JEOL, Tokyo, Japan). ASD’s purity was determined using energy-dispersive X-ray spectroscopy using a Zeiss Gemini500 scanning electron microscope equipped with X-Max^N 150 mm² silicon drift detector (Oxford Instrument, Abingdon, UK).

TiO₂ nanoparticles were obtained from Evonik Industries (Germany) as a fine white powder with a hydrophilic characteristic caused by hydroxyl groups on the surface. The nanoparticles consisted of aggregated primary particles; the mean diameter of the primary particle was approximately 21 nm, and the weight ratio of anatase/rutile was approximately 80/20 according to the manufacturer’s information.
Physicochemical characterization of TiO₂ nanoparticles was confirmed with an additional analytical method. The primary particle size and morphology were analyzed by a transmission electron microscope (JEM-2100F, JEOL, Japan) operating at 200 kV. TiO₂ NPs for transmission electron microscope (TEM) analysis were deposited on carbon-coated nickel mesh grids and were air-dried overnight before analysis. The purity was also analyzed with energy-dispersive X-ray (EDX) analysis on the same TEM images (JEM-2100F TEM equipped with an X-Max^N 150 mm² silicon drift detector, Oxford Instruments, UK). The average primary particle size was calculated by measuring at least 100 particles using an image analyzer program (DigitalMicrograph, Gatan Inc., USA). The hydrodynamic diameter and zeta potential of TiO₂ nanoparticles in deionized water (10 mg/ml concentration) were analyzed by the dynamic light scattering (DLS) method (ELS-8000, Otsuka Electronics, Japan).