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Uv 3900h

Manufactured by Hitachi
Sourced in Japan

The UV-3900H is a high-performance double-beam UV-Vis spectrophotometer manufactured by Hitachi. It is designed to accurately measure the absorbance, transmittance, and reflectance of samples in the ultraviolet and visible light spectrum. The instrument features a wide wavelength range, high-resolution optical system, and advanced data processing capabilities.

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2 protocols using uv 3900h

1

Comprehensive Characterization of NiAl-LDH Materials

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X-ray powder diffraction
(XRD) patterns were recorded using a D8 ADVANCE X-ray diffractometer
with Cu Kα radiation (λ = 0.15406 nm). The
scanning electron microscopy (SEM) images were recorded on an FEI-Sirion
200F field emission scanning electron microscope. The transmission
electron microscopy (TEM) images, high-resolution transmission electron
microscopy (HRTEM) images, selected area electron diffraction (SAED)
patterns, and the energy dispersive spectroscopy (EDS) spectra were
taken with an FEI-Tecnai G2 field emission transmission electron microscope.
The samples were obtained by peeling off the NiAl-LDH film from the
substrate. The Fourier transform infrared (FTIR) spectra were recorded
by a Thermo Nicolet 5700. The chemical state of LDHs was investigated
by X-ray photoelectron spectroscopy (XPS) on an ESCALAB 250Xi photoelectron
spectrometer with Al K (1486 eV) as the excitation light source. The
contents of metal ions in the solution were analyzed by an atomic
absorption spectrophotometer (TAS-990AFG). The UV–Vis diffuse
reflectance spectra were recorded by a UV–Vis spectrophotometer
(UV-3900H, Hitachi).
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2

Comprehensive Characterization of LDH Photocatalysts

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X-ray powder diffraction (XRD) patterns were recorded using a D8 ADVANCE X-ray diffractometer (Karlsruhe, Germany) with Cu Kα radiation (λ = 0.15406 nm). The scanning electron microscopy (SEM) images were recorded on a FEI-Sirion 200 F field emission scanning electron microscope (Hongkong, China). The transmission electron microscopy (TEM) images, high-resolution transmission electron microscopy (HRTEM) images, and the energy dispersive spectroscopy (EDS) spectra were taken with a FEI-Tecnai G2 field emission transmission electron microscope (Hongkong, China). The samples were obtained by peeling off LDH films from the substrate. Photocatalytic reactions were carried out using a 300 W Xe lamp as the light source and the light intensity in the visible region was about 85 mW·cm−2. The UV–Vis diffuse reflectance spectra were recorded by a UV–Vis spectrophotometer (UV-3900H, Hitachi, Tokyo, Japan). Fourier transform infrared (FTIR) spectra were recorded by a Thermo Nicolet 5700 (Waltham, MA, USA). The chemical state of LDHs was investigated by X-ray photoelectron spectroscopy (XPS) on a ESCALAB 250Xi photoelectron spectrometer (Waltham, MA, USA) with Al K (1486 Ev) as the excitation light source. The N2 adsorption/desorption tests were measured by Brunauer–Emmett–Teller (BET) measurements using a NOVA2200e surface area analyzer (Boynton Beach, FL, USA).
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