820 scanning electron microscope
The JEOL 820 is a scanning electron microscope that provides high-resolution imaging of samples. It uses a focused beam of electrons to scan the surface of a specimen, generating detailed images of the sample's topography and composition. The JEOL 820 is capable of magnifying specimens up to 200,000 times, enabling the observation of fine details and features at the microscopic level.
Lab products found in correlation
4 protocols using 820 scanning electron microscope
Mineral Composition Analysis via EMPA
Scanning Electron Microscopy of Pinopodes
Ultrastructural Analysis of Lens Fiber Cells
Scanning Electron Microscopy of Murine Lenses
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