1220ex transmission electron microscope
The JEOL 1220EX is a transmission electron microscope (TEM) designed for high-resolution imaging and analysis of materials at the nanoscale. The TEM utilizes a focused beam of accelerated electrons to interact with the sample, providing detailed information about the sample's internal structure, composition, and morphology. The core function of the JEOL 1220EX is to enable researchers and scientists to visualize and study the microstructure of materials with exceptional resolution and clarity.
3 protocols using 1220ex transmission electron microscope
Transmission Electron Microscopy of Recombinant Amelogenin
Ultrastructural Analysis of Differentiated Cells
Transmission Electron Microscopy of Postnatal Mouse Molars
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