X ray diffractometer

A Shimadzu X-ray diffractometer was used for powder X-ray diffraction (PXRD, Cu Kα radiation, λ = 1.5406 Å) measurements. Field-emission scanning electron microscopy (FE-SEM, Hitachi S-4700) with an energy-dispersive X-ray spectroscopy (EDS) detector was employed to characterize the sample surface morphologies. Field-emission transmission electron microscopy (FE-TEM, Philips Tecnai, F20, 200 kV, Korea Basic Science Institute, Chonnam National University, Amsterdam, Netherlands) with selected-area electron diffraction (SAED) was used to study the structural morphologies and lattice fringes. The surface oxidation states of the electrode samples were determined through X-ray photoelectron spectroscopy (XPS, Thermo VG Scientific, MultiLab 2000, Chonnam Center for Research Facilities, Al Kα X-ray source, Waltham, MA, USA). The spectrometer was calibrated with respect to C 1s at 284.8 eV.

A zetasizer (Particle Sizing Systems, Port Richey, FL, USA) was used to measure the particle size, PDI, and zeta potential of CSNPs and CSNP–SSL at 37 °C. Each measurement was repeated thrice, and the results are presented as mean ± standard deviation (SD). Each sample was properly diluted with DW before testing. UV–vis spectrophotometer was used to assess optical characteristics (Model Perkin Elmer Lambda). The FTIR spectra were collected over a range of 400–4000 cm⁻¹ using Perkin-Elmer (Spectrum-RX1, USA) FTIR spectroscopy. An X-ray diffractometer (Shimadzu Corporation, Kyoto, Japan) was used to conduct the XRD studies in 10–80° range using CuKα as the radiation source (k = 1.5418) produced at 30 kV and 30 mA. SEM was used to observe the morphologies of CSNPs and CSNP–SSL (SEM, Jeol FESEM JSM-7600F). TEM Images from a Tecnai F-12 JEOL-JEM 2100 TEM were captured at a 200 kV accelerating voltage. CSNPs and CSNP–SSL samples were homogeneously mixed with DW in an ultrasonic bath before being poured onto air-dried copper grids placed on filter paper and then dried at room temperature. The particle diameter size distribution versus frequency percentage of CSNPs and CSNP-SSL was calculated by measuring 50 particles with 100 m²/g specific surface area using ImageJ software (National Institutes of Health, Bethesda, MD, USA).

In this study, the XRD technique was used to identify the crystallinity of the samples, which were then submitted to the X-ray diffraction analysis (XRD) through a Shimadzu X-ray diffractometer (Shimadzu, Quioto, Japan), model XRD 7000, at room temperature, using copper’s Kα radiation (1.5418 Å), with an angular scan of 5° < 2θ < 45°, 40 kV tension, and 30 mA current [27 ].

The proposed Pt/BiVO₄ nanocomposite was determined using a transmission electron microscope for morphology and structure with an energy-dispersive X-ray spectroscope (TEM/EDS; JEM-2100F), and a field emission scanning electron microscope (FESEM; JEOL JSM-7500F) operated at 30 kV. Pt/BiVO₄ was characterized to understand its crystal structure using a Shimadzu X-ray diffractometer at 1.5405 Å at 40 kV and 30 mA, supported by a vertical goniometer in the range of 10° to 80° (2theta) at a scan speed of 2 °/min.

FT-IR spectra of the ZIF-8 nanoparticles and blend films were recorded at room temperature using IRAffinity-1 spectrometer (Bruker Corporation Blairica, Massachusetts, USA) attached to the universal ATR accessory over the wavenumber range from 4000 to 400 cm⁻¹ and 2 cm⁻¹ resolution. The films were mounted directly in the sample holder while the ZIF-8 nanoparticles were mixed with KBr powder where the pure KBr baseline was subtracted from the spectra. The XRD pattern of ZIF-8 nanoparticles were tested by X-ray diffractometer (Shimadzu Corporation, Tokyo, Japan) with a nickel-filtered Cu Kα radiation beam (40 mA and 40 kV). The analysis was scanned from 2θ = 3° to 50° with 1°/min scanning speed and 0.05° scan amplitude at ambient temperature. The Jade 6.0 XRD pattern processing software was utilized for statistical analysis.

Nanofluorescent sensor was characterized by high resolution Transmission Electron Microscope (TEM, JEM-2100, JEOL). The XRD patterns were recorded using Shimadzu X-ray diffractometer with CuKα₁ radiation (k = 1.54056 Å). The accelerating voltage of 40 kV and an emission current of 30 mA were used. The FT-IR spectra were recorded using JASCO-FT-IR 6800 spectrometer. The photoluminescence emission spectra were recorded at room temperature with a spectrofluorometer shimaduz RF5301PC. The luminescent lifetime of the prepared compounds was recorded using a PerkinElmer LS 55 luminescence spectrometer (USA). Surface charge of nanoparticles were calculated by Brookhaven zeta potential/particle size analyser.

An X-ray diffractometer (Shimadzu, Kyoto, Japan) was used to analyze β-CD, the physical mixture, and a-β-CD. The parameters were as follows: Cu target (40 kV, 40 mA), step scan: 0.02°/step, scan range 10°–80°, and scanning speed: 2°/min [22 (link)].