Jsm 6330f sem
The JSM-6330F is a scanning electron microscope (SEM) manufactured by JEOL. It is designed for high-resolution imaging of a wide range of samples. The JSM-6330F utilizes a field emission gun (FEG) electron source to provide high-brightness and high-resolution electron beams. The instrument is capable of achieving a resolution of up to 1.5 nanometers.
Lab products found in correlation
9 protocols using jsm 6330f sem
Micro-organism Surface Characterization
Analyzing EEC Surface Morphology via SEM
SEM Characterization of Nap-FF/HA Hydrogels
SEM Analysis of Tensile Samples
Characterization of Electrospun Fiber Morphology and Purification
Corrosion Analysis of Coated Samples
Gold/Palladium Sputtering and SEM Imaging
SEM Analysis of Coated Samples
Uterus Tissue Preparation for SEM
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