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Jsm 6330f sem

Manufactured by JEOL
Sourced in Japan

The JSM-6330F is a scanning electron microscope (SEM) manufactured by JEOL. It is designed for high-resolution imaging of a wide range of samples. The JSM-6330F utilizes a field emission gun (FEG) electron source to provide high-brightness and high-resolution electron beams. The instrument is capable of achieving a resolution of up to 1.5 nanometers.

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9 protocols using jsm 6330f sem

1

Micro-organism Surface Characterization

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The surface characteristics of the microalgae, yeast and their co-cultivation during culture were observed using a JSM-6330F SEM (Jeol, Japan) at 10 000, 5000, and 10 000× magnification.22 (link) The samples for SEM analysis were collected from the reactor and fixed with 2.5% glutaraldehyde in 0.1 M phosphate buffer at pH 7.2 for 4 h. Subsequently, the samples were dehydrated using a graded series of ethanol solutions: 25%, 50%, 75%, 90% and 100% (three times for each concentration), and then sputter coated with gold.
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2

Analyzing EEC Surface Morphology via SEM

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The effect of miR-182 on the surface morphology of EEC was detected by SEM (Scanning Electron Microscopy) [38 ]. In short, glutaraldehyde-fixed (2.5%) samples were thoroughly washed with PBS buffer, dehydrated in graded ethanol, placed in 2% isoamyl alcohol for 3 hours, and underwent critical point drying. The samples were attached to the sample stage for observation with the surface (endometrial cavity surface) up and painted with silver conductive plastic using a vacuum coating apparatus for coating metal samples. Then, the samples were observed under the JSM-6330F SEM (JEOL, Japan).
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3

SEM Characterization of Nap-FF/HA Hydrogels

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To characterize the surface morphology of the Nap-FF/HA hydrogels, scanning electron microscope images were captured using a JSM-6330F SEM (JEOL, Japan). The hydrogel samples were prepared by lyophilization overnight in an Alpha 1–4LD plus freeze drier (Mettler Toledo, Switzerland). Then the samples were placed on the working stage using black double-sided adhesive tape. The surface of the hydrogel samples was sputter-coated with gold for seconds under argon before imaging.
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4

SEM Analysis of Tensile Samples

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SEM micrographs for surface appearances of the parts and fracture cross-sectional surfaces of the tensile samples were obtained using a JEOL JSM6330F SEM (Tokyo, Japan) with a field emission gun and an acceleration voltage of 3.0 kV. All samples were dried and sputtered with platinum before testing.
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5

Characterization of Electrospun Fiber Morphology and Purification

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Fiber morphology was evaluated by scanning electron microscopy (SEM). Samples were prepared for SEM by adhering onto aluminum stubs with conductive carbon tape before sputter coating with gold-palladium to a 3.5nm thickness and viewing on a JSM-6330F SEM (JEOL, Tokyo, Japan). Fiber diameter was measured by image analysis with ImageJ (NIH, Bethesda, MD).
Purification (removal of pPGS and PVA) was evaluated by mass loss. Dry samples were weighed on a microbalance before undergoing washing protocols. Sample thicknesses were also measured with dial calipers before and after purification. Fourier transform infrared attenuated total reflectance (ATR-FTIR) was measured on a Nicolet iS10 FTIR spectrometer (Thermo Scientific, Waltham, MA) after 1) electrospinning, 2) crosslinking, and 3) purification. Samples were compared to control films of pure PGS at the same crosslinking conditions. The thermal properties for the same groups were measured by differential scanning calorimetry (DSC, Q200, TA Instruments). Samples underwent two cycles of heating to 200°C and cooling to −80°C at 20°C/min.
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6

Corrosion Analysis of Coated Samples

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SEM analysis was conducted using a Jeol JSM 6330F SEM. Accelerating voltage was 3 kV. Samples were analyzed before corrosion and after 22 days of corrosion in PBS, refreshing PBS every day. Following corrosion, samples were dipped in DI water followed by ethanol, air dried, and stored in a desiccator until imaging. Coating integrity and surface morphology of coated and uncoated samples were analyzed. Due to lack of EDX analysis capability on JEOL JSM 6330F, chemical analysis was conducted on a Jeol JSM6510 SEM using an Oxford Instruments X-ray analyzer and Inca Software. Working distance was 10 mm and accelerating voltage was 20 kV. Elemental identification was conducted automatically through the Inca EDX software with the three dominant elements identified being magnesium, oxygen, and phosphorus.
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7

Gold/Palladium Sputtering and SEM Imaging

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Samples mounted on copper tape were coated with 3nm of Gold/Palladium (60/40) using a Cressington 108auto sputter coater (Watford, UK). Imaging was conducted on a JSM 6330F SEM (JEOL, Japan) at an accelerating voltage of 3kV. Working distance was adjusted automatically to allow for optimal image quality.
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8

SEM Analysis of Coated Samples

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SEM analysis was conducted using a Jeol JSM 6330F SEM using an accelerating voltage of 3 kV. Samples were analyzed following above drying procedures in addition to an overnight storage in a vacuum desiccator. Coating integrity and surface morphology of coated and uncoated samples were analyzed.
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9

Uterus Tissue Preparation for SEM

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Uterus samples were collected when the left uterine horn was injected with miR-431 agomir and the other side was used as negative control. Firstly, samples were xed with 2.5% glutaraldehyde xed solution at 4℃ for more than 6h. Then, 0.1M/L PBS with pH7.2 was ushed every 5 minutes, rinse for 6 times in total. Subsequently, samples were progressively dehydrated in an alcohol concentration gradient solution, followed by 2% isoamyl alcohol for 3 h and freeze drying. Samples were then painted with silver conductive plastic using a vacuum coating apparatus. Finally, samples were observed and photographed under the JSM-6330F SEM (JEOL, Japan).
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