FT-IR was performed using a VERTEX70 (Bruker, Germany). XPS was carried out using an AXIS Ultra DLD (Kratos, England). X-ray diffraction (XRD) was performed using a D8 advance (Bruker, Germany). TEM images were acquired using either a JEOL JEM-2100Plus (Japan) or a Bio-TEM Hitachi H-7650 operating at 80 kV. SEM images were acquired using an SU3500 instrument (Techcomp, China). Energy dispersive spectrometer (EDS) was performed using an OXFORD instruments attachment (United Kingdom). Particle size distributions were obtained with a laser particle size distribution analyzer (ZSE, Malvern, United Kingdom). TG analysis and differential scanning calorimetry (DSC) analyses were carried out under an oxygen atmosphere using an STA449F5 (NETZSCH, Germany).
Su3500
Manufactured by Techcomp
Sourced in China
The SU3500 is a scanning electron microscope (SEM) designed for high-resolution imaging and analysis of a wide range of samples. It features a state-of-the-art electron optics system and advanced detectors for detailed observation and characterization of micro- and nano-scale features.
Automatically generated - may contain errors
Lab products found in correlation
Vertex 70, by Bruker (2 mentions)
D8 advance, by Bruker (2 mentions)
Sta 449 f5, by Netzsch (2 mentions)
Axis ultra dld, by Shimadzu (1 mentions)
H 7650 transmission electron microscope, by Hitachi (1 mentions)
D8 advance system, by Bruker (1 mentions)
Nicolet is50 spectrometer, by Thermo Fisher Scientific (1 mentions)
Escalab 250xi xps instrument, by Thermo Fisher Scientific (1 mentions)
H 7650, by Hitachi (1 mentions)
Escalab xi, by Thermo Fisher Scientific (1 mentions)
3 protocols using su3500
1
Comprehensive Material Characterization Techniques
2
Characterization of CS-Fe3O4 Nanoparticles
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Fourier transform infrared spectroscopy (FT-IR) was performed using a Nicolet iS50 spectrometer (Thermo Fisher Scientific, MA, United States). XPS was performed with an ESCALAB 250 Xi+ XPS instrument (Thermo Fisher Scientific, MA, United States). X-ray diffraction (XRD) was performed with a D8 Advance system (Bruker, Germany). TG and DSC analyses were performed under an oxygen atmosphere using a simultaneous thermal analyzer 409 CD (Netzsch-Gerätebau GmbH, Germany). CS-Fe3O4 nanoparticles were thoroughly dissolved in 1% w/v acetic acid and observed with an H-7650 transmission electron microscope (Hitachi, Tokyo, Japan). The morphology of Fe3O4 and CS-Fe3O4 nanoparticles was determined by SEM with a SU3500 instrument (Techcomp, Shanghai, China).
3
Comprehensive Characterization of Carbon-Doped MoSe2
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Fourier transform infrared (FT-IR) was carried out between 400 and 4000 cm−1 using a Bruker spectrophotometer (VERTEX70, Bruker, Germany). The carbon-doped MoSe2 particles were investigated by X-ray photoelectron spectroscopy (XPS) analysis (Thermo Fisher ESCALAB Xi+, USA). X-ray diffraction (XRD) characterization was used to investigate the crystal phase structure patterns (D8 advance, Bruker, Germany). Scanning electron microscopy (SEM) was used to observe the MoSe2 (SU3500, Techcomp, China). Energy dispersive spectrometer (EDS) was used to do the EDS elemental maps of the MoSe2 on silicon wafer (OXFORD instruments, UK). Transmission electron microscope (TEM) (H-7650, HITACHI, Japan) was used to observe the MoSe2. The particle size and distribution were determined by laser particle size distribution analyzer (ZSE, Malvern, UK). Thermo gravimetric analysis (TG) and differential scanning calorimetry (DSC) analyses were under an oxygen atmosphere from 30 to 1000 °C (STA449F5, NETZSCH, Germany).
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