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250 350 khz cantilevers

Manufactured by Veeco
Sourced in United States

The 250–350 kHz cantilevers are a line of lab equipment designed for atomic force microscopy (AFM) applications. These cantilevers operate within the specified frequency range and are suitable for a variety of research and analytical tasks.

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2 protocols using 250 350 khz cantilevers

1

Atomic Force Microscopy of Samples

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An atomic force microscope (MultiMode V, USA) was used to reveal the morphology of the samples. The 250–350 kHz cantilevers (Veeco, Plainview, NY, USA) with silicone tips (tip curvature radius is of 10–13 nm) were used in all measurements. The microscopic images were obtained with a 512 × 512 resolution. The scanning rate was 1 Hz. Samples were fixed on a 12-mm metal SPM specimen discs using adhesive carbon tabs (AgarScientific, Essex, UK).
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2

Morphological Characterization of Particles by AFM

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An atomic force microscope (MultiMode V, USA) has been used to reveal the morphology of the particles. The morphology of the particles was investigated on the mica surface and on a surface of highly oriented pyrolytic graphite (HOPG, Veeco Inc.). 250-350 kHz cantilevers (Veeco, USA) with silicone tips (tip curvature radius is of 10-12 nm) have been used in all measurements. The microscopic images were obtained with 512 Â 512 resolution. The scanning rate was 1 Hz. The antivibrational system (SG0508) has been used to eliminate external distortions. The tip-convolution effect has been minimized by processing the obtained AFM data with the use of the software (WSxM 5.0, Zod 2.0 and MatLAB). The method of tip-convolution effect minimizing has been described in detail in ref. 24. The calibration has been performed by the use of an imaging special calibration grid (STR3-1800P, VLSI Standards Inc.) in the temperature range of 20-60 1C. The transmission electron microscopy (TEM) images were obtained using a Hitachi HT7700, Japan. The images were acquired at an accelerating voltage of 100 kV. Samples were dispersed on 300 mesh copper grids with continuous carbon-formvar support films.
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