The X-ray diffraction (XRD) analysis of nanopowders was carried out on a STOE-STADI MP diffractometer equipped using graphite-monochromated Mo Kα radiation (0.71073 Å) source and operating in transmission mode. Fourier transform infrared (FTIR) spectra were recorded with PerkinElmer FTIR spectrophotometer 400 in the range 400–4000 cm−1. Scanning electron micrographs were performed on a Nova Nano SEM 430 Company FEI (max. acceleration voltage 30 kV). Electron-X-ray spectroscopy was performed on an Apollo X EDAX (working distance 5 mm; entry angle 35°). The morphologies and composition of the samples were observed by Transmission Electron Microscope (TEM) using Zeiss LEO 912 instrument equipped with LaB6-cathode operated at 120 kV high voltage. The dynamic light scattering experiments (DLS) were measured with a Malvern instruments Zetasizer Nano SZ. Phases of thin films were determined Magnetic measurements were performed with a superconducting quantum interference device (SQUID) magnetometer (Quantum Design, MPMS XL-7). Thermogravimetric analysis (TGA) characterization was performed on Netzsch STA 449C Jupiter. Samples were characterized in Al2O3 chamber in atmosphere of dry nitrogen or synthetic air (80% N2 + 20% O2), flow: 70 cm3 min−1, heating ramp 10 °C min−1 to 900 °C.
Mp diffractometer
Manufactured by STOE
The MP diffractometer is a laboratory instrument used for the analysis and characterization of crystalline materials. It is designed to measure the diffraction pattern of X-rays or neutrons interacting with the sample, which provides information about the structure, composition, and properties of the material.
Automatically generated - may contain errors
2 protocols using mp diffractometer
1
Comprehensive Nanomaterial Characterization Protocol
2
Characterization of NiFe2O4@SiO2-PEI Nanocomposite
Check if the same lab product or an alternative is used in the 5 most similar protocols
+ Expand
Powder X-ray diffraction (PXRD) measurements were carried out on a Shimadzu 6100 using Cu-Kα (λ = 0.15406 Å) radiation at 298 K on solid powder samples of freshly prepared and recovered materials of NiFe2O4@SiO2–PEI. The PXRD of NiFe2O4 was recorded on an STOE-STADI MP diffractometer equipped with a Cu-Kα1 radiation (λ = 0.15406 Å) source and operating in transmission mode. Thermogravimetry–differential thermal analysis (TGA-DTA) was recorded on a Shimadzu TGA-DTG-60H instrument on a powder sample. Fourier-transformed (FT)-IR spectra were recorded on a Bruker Alpha I spectrophotometer on KBr disks. Field emission scanning electron microscopy (FE-SEM) and energy-dispersive X-ray spectroscopy (EDX) were carried out on a JEOL JSM-IT 100 instrument.
About PubCompare
Our mission is to provide scientists with the largest repository of trustworthy protocols and intelligent analytical tools, thereby offering them extensive information to design robust protocols aimed at minimizing the risk of failures.
We believe that the most crucial aspect is to grant scientists access to a wide range of reliable sources and new useful tools that surpass human capabilities.
However, we trust in allowing scientists to determine how to construct their own protocols based on this information, as they are the experts in their field.
Ready to get started?
Sign up for free.
Registration takes 20 seconds.
Available from any computer
No download required
Revolutionizing how scientists
search and build protocols!