A triple grating Raman spectrometer (Horiba JY T64000†, 1800 mm−1 grating) coupled to a liquid nitrogen cooled CCD detector was used to collect Raman spectra. The excitation wavelength was 632.8601 nm from a He–Ne laser and spectra were measured in the 180° backscattering configuration. Raman spectra as a function of temperature and magnetic field were collected using an attoDRY cryostat (Attocube Inc.†), where the sample was zero-field cooled and studied with a magnetic field compatible objective (×50, N.A. 0.82). Ultra-broadband polarizers and achromatic half wave plates were used to select and control polarization, including correcting for Faraday rotation in the objective under applied magnetic field. The laser power was ≈150 µW to avoid local heating and integration times were ≈12 min.
Jy t64000
Manufactured by Horiba
Sourced in France
The JY T64000 is a high-performance Raman spectrometer designed for advanced materials analysis. It features a triple-grating monochromator, providing high spectral resolution and sensitivity across a wide range of wavelengths.
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Lab products found in correlation
Cary 5000, by Agilent Technologies (2 mentions)
Lambda 1050, by PerkinElmer (1 mentions)
Supra 55, by Zeiss (1 mentions)
D2 phaser, by Bruker (1 mentions)
Ds ri2, by Nikon (1 mentions)
Dimension 3000, by Bruker (1 mentions)
Nexsa g2, by Thermo Fisher Scientific (1 mentions)
Tecnai osiris tem, by Thermo Fisher Scientific (1 mentions)
Hr evolution, by Horiba (1 mentions)
7 protocols using jy t64000
1
Polarized Raman Spectroscopy in Cryostat
2
Raman and XPS Characterization of Patterned Samples
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Raman spectra are obtained on a single-gating micro-Raman spectrometer (Horiba-JY T64000) excited with 532 nm laser. The signal is collected through a 100 × objective lens, dispersed with a grating of 1800 g mm−1, and detected by a liquid nitrogen-cooled charge-coupled device. The samples are in-situ transferred to an XPS chamber for analysis. XPS measurements are performed in a VG ESCALAB 220i-XL system using a monochromatic Al Kα source. The pass energy of the analyzer is set to 10 eV for high measurement resolution. After that, a layer of photoresist is coated, UV-exposed under a mask and developed out a series of 61 μm × 37 μm rectangular windows.
3
Photoluminescence and Raman Characterization
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Photoluminescence was measured at the same area before and after F4TCNQ deposition. Both the laser beams (solid-state laser, 473 nm and Nd:YAG solid-state laser, 532 nm) were collimated and focused through a ×100 objective onto the sample surface. All the spectra were collected using a confocal triple-grating spectrometer (Horiba-JY T64000). Raman spectra were recorded using a Renishaw Raman microscope configured with a charge-coupled device array detector with the excitation laser line of 532 nm. Atomic force microscopy was performed on a Digital Instruments 3100.
4
Nanoflower Characterization by SEM, Raman, UV-vis
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Scanning electron microscopy investigation was carried out using a JSM-IT500A electron microscope (JEOL, Tokyo, Japan) under the condition of 30 kV acceleration voltages. The assessment of Raman spectra was performed by JY-T64000 (HORIBA Jobin Yvon, Paris, France) equipped with a 532 nm laser. The instrument is equipped with a microscope with a focal spot size in the range of a few micrometers. After pretreating for 1 h under vacuum, the nanoflowers were characterized by a Lambda 1050+ (PerkinElmer, Waltham, MA, USA) Diffuse reflectance UV-vis Spectrometer (DRUVS) using BaSO4 as a reference to determine its UV-vis absorption spectra.
5
Multi-Modal Characterization of Advanced Materials
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Optical images are collected by optical microscopy (Nikon DS-Ri2). AFM topography is acquired on a Bruker Dimension 3000 in a tapping mode. SEM images are taken on Zeiss Supra 55. XPS spectra are collected from PHI Versaprobe II. TEM measurements are performed on a FEI Tecnai Osiris TEM, operating at a 200 keV accelerating voltage. SAED is measured on a JEOL 2100 TEM. The SAED simulation is performed through STEM_CELL software. PXRD scanning are performed on a Bruker D2 Phaser with Cu Kα radiation of wavelength λ = 1.54184 Å at 30 kV and 10 mA. SERS measurement is performed on a Horiba-JY T64000, using a triple-grating mode with 1800 g mm–1 gratings, and a 532 nm laser line. Solution- and solid-state UV–Vis spectra are taken with Agilent Cary 5000. REELS measurement is carried out on Thermo Scientific Nexsa G2 and data is analyzed using Avantage software.
6
Optical Characterization of Novel Materials
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The ER scattering and PL measurements were carried out on a micro-Raman spectrometer (Horiba-JY T64000), and the signal was collected through a 50× long-working-distance objective. A cryostat (Cryo Industries of America, USA) was used to provide a vacuum environment and a continuous temperature from 5 to 300 K by liquid helium flow. Both ER scattering and PL measurements were performed using a single-grating mode with a grating (150 g/mm) in backscattered geometry. A series of laser lines, ranging from 454 to 568 nm, were from a Kr+/Ar+ ion laser (Coherent Innova 70C Spectrum) and used to excite the sample. The absorbance measurement was conducted on a spectrophotometer (Agilent Cary 5000). The polarized optical measurements were performed on another micro-Raman spectrometer (Horiba HR Evolution), and the signal was collected through a 100× objective with correction ring. The signals were dispersed with a grating (100 g/mm). A solid-state laser (λ = 473 nm) was used to excite the sample.
7
Raman Spectroscopy of Material Samples
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In situ Raman scatting spectroscopy measurements are carried out at room temperature using a micro-Raman spectrometer (Horiba JY-T64000) in a backscattering configuration. A solid-state laser (λ = 532 nm) and an Air ion laser (λ = 488 nm) have been used to excite the samples. The backscattered signal was collected through a 100× objective and dispersed by a 1800-g/mm grating.
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